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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 6 — Mar. 12, 2012
  • pp: 5955–5961

Non-iterative characterization of few-cycle laser pulses using flat-top gates

Romedi Selm, Günther Krauss, Alfred Leitenstorfer, and Andreas Zumbusch  »View Author Affiliations

Optics Express, Vol. 20, Issue 6, pp. 5955-5961 (2012)

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We demonstrate a method for broadband laser pulse characterization based on a spectrally resolved cross-correlation with a narrowband flat-top gate pulse. Excellent phase-matching by collinear excitation in a microscope focus is exploited by degenerate four-wave mixing in a microscope slide. Direct group delay extraction of an octave spanning spectrum which is generated in a highly nonlinear fiber allows for spectral phase retrieval. The validity of the technique is supported by the comparison with an independent second-harmonic fringe-resolved autocorrelation measurement for an 11 fs laser pulse.

© 2012 OSA

OCIS Codes
(190.0190) Nonlinear optics : Nonlinear optics
(320.7100) Ultrafast optics : Ultrafast measurements
(180.4315) Microscopy : Nonlinear microscopy

ToC Category:
Ultrafast Optics

Original Manuscript: December 22, 2011
Revised Manuscript: February 3, 2012
Manuscript Accepted: February 10, 2012
Published: February 27, 2012

Romedi Selm, Günther Krauss, Alfred Leitenstorfer, and Andreas Zumbusch, "Non-iterative characterization of few-cycle laser pulses using flat-top gates," Opt. Express 20, 5955-5961 (2012)

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