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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 7 — Mar. 26, 2012
  • pp: 7388–7397

Confocal surface plasmon microscopy with pupil function engineering

Bei Zhang, Suejit Pechprasarn, Jing Zhang, and Michael G. Somekh  »View Author Affiliations

Optics Express, Vol. 20, Issue 7, pp. 7388-7397 (2012)

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Surface Plasmon microscopy can measure local changes of refractive index on the micron scale. Interferometric plasmon imaging delivers quantitative high spatial resolution sensitive to refractive index. In addition the so called V(z) method allows image contrast to be controlled by varying the sample defocus without substantially degrading spatial resolution. Here, we show how a confocal system provides a simpler and more stable alternative. This system, however, places greater demands on the dynamic range of the system. We therefore use a spatial light modulator to engineer the microscope pupil function to suppress light that does not contribute to the signal.

© 2012 OSA

OCIS Codes
(060.4080) Fiber optics and optical communications : Modulation
(110.0110) Imaging systems : Imaging systems
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(180.0180) Microscopy : Microscopy

ToC Category:

Original Manuscript: January 26, 2012
Revised Manuscript: March 9, 2012
Manuscript Accepted: March 9, 2012
Published: March 15, 2012

Virtual Issues
Vol. 7, Iss. 5 Virtual Journal for Biomedical Optics

Bei Zhang, Suejit Pechprasarn, Jing Zhang, and Michael G. Somekh, "Confocal surface plasmon microscopy with pupil function engineering," Opt. Express 20, 7388-7397 (2012)

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