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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 8 — Apr. 9, 2012
  • pp: 8974–8981

Loss mechanisms of surface plasmon polaritons propagating on a smooth polycrystalline Cu surface

Hyun Seok Lee, Chawki Awada, Salim Boutami, Fabrice Charra, Ludovic Douillard, and Roch Espiau de Lamaestre  »View Author Affiliations


Optics Express, Vol. 20, Issue 8, pp. 8974-8981 (2012)
http://dx.doi.org/10.1364/OE.20.008974


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Abstract

We study the propagation properties of surface plasmon polaritons on a Cu surface by means of photoemission electron microscopy. Use of a CMOS process to fabricate the Cu thin film is shown to enable very high propagation distances (up to 65 μm at 750 nm wavelength), provided that the copper native oxide is removed. A critical review of the optical loss mechanisms is undertaken and shed light on the effect of single grain boundaries in increasing the propagation losses of the plasmon. A microscopic interpretation is provided, relying on groove induced electromagnetic hot spots.

© 2012 OSA

OCIS Codes
(030.5770) Coherence and statistical optics : Roughness
(120.4530) Instrumentation, measurement, and metrology : Optical constants
(160.3900) Materials : Metals
(190.4180) Nonlinear optics : Multiphoton processes
(240.6680) Optics at surfaces : Surface plasmons
(240.6675) Optics at surfaces : Surface photoemission and photoelectron spectroscopy

ToC Category:
Optics at Surfaces

History
Original Manuscript: December 13, 2011
Revised Manuscript: January 23, 2012
Manuscript Accepted: February 2, 2012
Published: April 3, 2012

Citation
Hyun Seok Lee, Chawki Awada, Salim Boutami, Fabrice Charra, Ludovic Douillard, and Roch Espiau de Lamaestre, "Loss mechanisms of surface plasmon polaritons propagating on a smooth polycrystalline Cu surface," Opt. Express 20, 8974-8981 (2012)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-20-8-8974


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