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Optics Express

Optics Express

  • Editor: C. Martijn de Sterke
  • Vol. 20, Iss. 9 — Apr. 23, 2012
  • pp: 9431–9441

Surface wave sensors based on nanometric layers of strongly absorbing materials

Yichen Zhang, Christophe Arnold, Peter Offermans, and Jaime Gómez Rivas  »View Author Affiliations


Optics Express, Vol. 20, Issue 9, pp. 9431-9441 (2012)
http://dx.doi.org/10.1364/OE.20.009431


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Abstract

We demonstrate the excitation of guided modes in thin layers of strongly absorbing chalcogenide glasses. These modes are similar to surface plasmon polaritons in terms of resonance width and shift with changes in the permittivity of the surrounding medium. We exploit these characteristics to demonstrate a high sensitivity chalcogenide glass refractive index sensor that outperforms gold surface plasmon resonance sensors at short wavelengths in the visible. This demonstration opens a new range of possibilities for sensing using different materials.

© 2012 OSA

OCIS Codes
(240.6690) Optics at surfaces : Surface waves
(310.6860) Thin films : Thin films, optical properties
(310.2785) Thin films : Guided wave applications

ToC Category:
Optics at Surfaces

History
Original Manuscript: February 1, 2012
Revised Manuscript: March 27, 2012
Manuscript Accepted: March 27, 2012
Published: April 10, 2012

Citation
Yichen Zhang, Christophe Arnold, Peter Offermans, and Jaime Gómez Rivas, "Surface wave sensors based on nanometric layers of strongly absorbing materials," Opt. Express 20, 9431-9441 (2012)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-20-9-9431


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