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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 21, Iss. 1 — Jan. 14, 2013
  • pp: 112–121

Super-resolution differential interference contrast microscopy by structured illumination

Jianling Chen, Yan Xu, Xiaohua Lv, Xiaomin Lai, and Shaoqun Zeng  »View Author Affiliations

Optics Express, Vol. 21, Issue 1, pp. 112-121 (2013)

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We propose a structured illumination differential interference contrast (SI-DIC) microscopy, breaking the diffraction resolution limit of differential interference contrast (DIC) microscopy. SI-DIC extends the bandwidth of coherent transfer function of the DIC imaging system, thus the resolution is improved. With 0.8 numerical aperture condenser and objective, the reconstructed SI-DIC image of 53 nm polystyrene beads reveals lateral resolution of approximately 190 nm, doubling that of the conventional DIC image. We also demonstrate biological observations of label-free cells with improved spatial resolution. The SI-DIC microscopy can provide sub-diffraction resolution and high contrast images with marker-free specimens, and has the potential for achieving sub-diffraction resolution quantitative phase imaging.

© 2013 OSA

OCIS Codes
(100.6640) Image processing : Superresolution
(110.1650) Imaging systems : Coherence imaging
(180.0180) Microscopy : Microscopy

ToC Category:

Original Manuscript: October 23, 2012
Revised Manuscript: December 17, 2012
Manuscript Accepted: December 17, 2012
Published: January 2, 2013

Virtual Issues
Vol. 8, Iss. 2 Virtual Journal for Biomedical Optics

Jianling Chen, Yan Xu, Xiaohua Lv, Xiaomin Lai, and Shaoqun Zeng, "Super-resolution differential interference contrast microscopy by structured illumination," Opt. Express 21, 112-121 (2013)

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