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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 21, Iss. 1 — Jan. 14, 2013
  • pp: 1181–1188

Sidewall gratings in ultra-low-loss Si3N4 planar waveguides

Michael Belt, Jock Bovington, Renan Moreira, Jared F. Bauters, Martijn J. R. Heck, Jonathon S. Barton, John E. Bowers, and Daniel J. Blumenthal  »View Author Affiliations


Optics Express, Vol. 21, Issue 1, pp. 1181-1188 (2013)
http://dx.doi.org/10.1364/OE.21.001181


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Abstract

We demonstrate sidewall gratings in an ultra-low-loss Si3N4 planar waveguide platform. Through proper geometrical design we can achieve coupling constant values between 13 and 310 cm−1. The TE waveguide propagation loss over the range of 1540 to 1570 nm is below 5.5 dB/m.

© 2013 OSA

OCIS Codes
(050.2770) Diffraction and gratings : Gratings
(130.0130) Integrated optics : Integrated optics
(230.7390) Optical devices : Waveguides, planar

ToC Category:
Integrated Optics

History
Original Manuscript: August 10, 2012
Revised Manuscript: September 15, 2012
Manuscript Accepted: September 19, 2012
Published: January 10, 2013

Citation
Michael Belt, Jock Bovington, Renan Moreira, Jared F. Bauters, Martijn J. R. Heck, Jonathon S. Barton, John E. Bowers, and Daniel J. Blumenthal, "Sidewall gratings in ultra-low-loss Si3N4 planar waveguides," Opt. Express 21, 1181-1188 (2013)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-21-1-1181


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