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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 21, Iss. 10 — May. 20, 2013
  • pp: 11819–11826

Inner structure detection by optical tomography technology based on feedback of microchip Nd:YAG lasers

Chunxin Xu, Shulian Zhang, Yidong Tan, and Shijie Zhao  »View Author Affiliations

Optics Express, Vol. 21, Issue 10, pp. 11819-11826 (2013)

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We describe a new optical tomography technology based on feedback of microchip Nd:YAG lasers. In the case of feedback light frequency-shifted, light can be magnified by a fact of 106 in the Nd:YAG microchip lasers, which makes it possible to realize optical tomography with a greater depth than current optical tomography. The results of the measuring and imaging of kinds of samples are presented, which demonstrate the feasibility and potential of this approach in the inner structure detection. The system has a lateral resolution of ~1μm, a vertical resolution of 15μm and a longitudinal scanning range of over 10mm.

© 2013 OSA

OCIS Codes
(040.2840) Detectors : Heterodyne
(180.1790) Microscopy : Confocal microscopy
(180.5810) Microscopy : Scanning microscopy
(110.6955) Imaging systems : Tomographic imaging

ToC Category:

Original Manuscript: April 4, 2013
Revised Manuscript: April 27, 2013
Manuscript Accepted: April 27, 2013
Published: May 7, 2013

Virtual Issues
Vol. 8, Iss. 6 Virtual Journal for Biomedical Optics

Chunxin Xu, Shulian Zhang, Yidong Tan, and Shijie Zhao, "Inner structure detection by optical tomography technology based on feedback of microchip Nd:YAG lasers," Opt. Express 21, 11819-11826 (2013)

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