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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 21, Iss. 10 — May. 20, 2013
  • pp: 11994–12001

Micro-strain sensing using wrinkled stiff thin films on soft substrates as tunable optical grating

Teng Ma, Hanshuang Liang, George Chen, Benny Poon, Hanqing Jiang, and Hongbin Yu  »View Author Affiliations

Optics Express, Vol. 21, Issue 10, pp. 11994-12001 (2013)

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We report a strain sensing approach that utilizes wrinkled patterns on poly (dimethylsiloxane) (PDMS) as an optical grating to measure thermally-induced strain of different materials. The mechanism for the strain sensing and the effect of PDMS grating on strain sensing are discussed. By bonding the PDMS grating onto a copper or silicon substrate, the coefficient of thermal expansion (CTE) of the substrates can be deduced by measuring the diffraction angle change due to the change in PDMS grating periodicity when thermal strain is introduced. The measured CTEs agree well with the known reference values.

© 2013 OSA

OCIS Codes
(050.0050) Diffraction and gratings : Diffraction and gratings
(220.4000) Optical design and fabrication : Microstructure fabrication

ToC Category:
Diffraction and Gratings

Original Manuscript: March 29, 2013
Revised Manuscript: April 25, 2013
Manuscript Accepted: April 26, 2013
Published: May 9, 2013

Teng Ma, Hanshuang Liang, George Chen, Benny Poon, Hanqing Jiang, and Hongbin Yu, "Micro-strain sensing using wrinkled stiff thin films on soft substrates as tunable optical grating," Opt. Express 21, 11994-12001 (2013)

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