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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 21, Iss. 10 — May. 20, 2013
  • pp: 12934–12941

Enhancement of graphene visibility on transparent substrates by refractive index optimization

Hugo Gonçalves, Luís Alves, Cacilda Moura, Michael Belsley, Tobias Stauber, and Peter Schellenberg  »View Author Affiliations

Optics Express, Vol. 21, Issue 10, pp. 12934-12941 (2013)

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Optical reflection microscopy is one of the main imaging tools to visualize graphene microstructures. Here is reported a novel method that employs refractive index optimization in an optical reflection microscope, which greatly improves the visibility of graphene flakes. To this end, an immersion liquid with a refractive index that is close to that of the glass support is used in-between the microscope lens and the support improving the contrast and resolution of the sample image. Results show that the contrast of single and few layer graphene crystals and structures can be enhanced by a factor of 4 compared to values commonly achieved with transparent substrates using optical reflection microscopy lacking refractive index optimization.

© 2013 OSA

OCIS Codes
(110.0180) Imaging systems : Microscopy
(240.0310) Optics at surfaces : Thin films
(310.6860) Thin films : Thin films, optical properties
(160.4236) Materials : Nanomaterials

ToC Category:

Original Manuscript: February 14, 2013
Revised Manuscript: April 18, 2013
Manuscript Accepted: April 26, 2013
Published: May 17, 2013

Hugo Gonçalves, Luís Alves, Cacilda Moura, Michael Belsley, Tobias Stauber, and Peter Schellenberg, "Enhancement of graphene visibility on transparent substrates by refractive index optimization," Opt. Express 21, 12934-12941 (2013)

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