Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Optical coupling from InGaAs subcell to InGaP subcell in InGaP/InGaAs/Ge multi-junction solar cells

Open Access Open Access

Abstract

Spatially-resolved electroluminescence (EL) images in the triple-junction InGaP/InGaAs/Ge solar cell have been investigated to demonstrate the subcell coupling effect. Upon irradiating the infrared light with an energy below bandgap of the active layer in the top subcell, but above that in the middle subcell, the EL of the top subcell quenches. By analysis of EL intensity as a function of irradiation level, it is found that the coupled p-n junction structure and the photovoltaic effect are responsible for the observed EL quenching. With optical coupling and photoswitching effects in the multi-junction diode, a concept of infrared image sensors is proposed.

©2012 Optical Society of America

Full Article  |  PDF Article
More Like This
Current matching using CdSe quantum dots to enhance the power conversion efficiency of InGaP/GaAs/Ge tandem solar cells

Ya-Ju Lee, Yung-Chi Yao, Meng-Tsan Tsai, An-Fan Liu, Min-De Yang, and Jiun-Tsuen Lai
Opt. Express 21(S6) A953-A963 (2013)

Charge separation in subcells of triple-junction solar cells revealed by time-resolved photoluminescence spectroscopy

David M. Tex, Mitsuru Imaizumi, and Yoshihiko Kanemitsu
Opt. Express 23(24) A1687-A1692 (2015)

Cited By

Optica participates in Crossref's Cited-By Linking service. Citing articles from Optica Publishing Group journals and other participating publishers are listed here.

Alert me when this article is cited.


Figures (9)

Fig. 1
Fig. 1 Schematic illustration of the investigated InGaP/InGaAs/Ge triple-junction solar cell.
Fig. 2
Fig. 2 Electroluminescence (EL) images of the triple-junction InGaP/InGaAs/Ge solar cell taken with the measurement (a) without and (b) with irradiation of an extra IR laser. The scale bar applies to images (a)-(b).
Fig. 3
Fig. 3 The dependence of EL intensity of the top subcell on injection current without (the solid line) and with (the dashed line) irradiation of an extra IR laser.
Fig. 4
Fig. 4 Surface maps of EL intensity of the top subcell with different irradiation powers of IR light: (a) 0 (b) 1.8 (c) 8.3, and (d) 18.7 mW.
Fig. 5
Fig. 5 EL intensity of profile of a line scan in the top subcell with different irradiation power of IR light: (a) 0, (b) 1.8, (c) 8.3, (d) 18.7, and (e) 59.0 mW. The dotted line displays the beam profile of the IR laser.
Fig. 6
Fig. 6 Integrated EL intensity from a line scan versus the irradiation power of IR light.
Fig. 7
Fig. 7 Electroreflectance spectra of the InGaP top subcell without (the solid line) and with (the dotted line) the IR illumination of 20 mW.
Fig. 8
Fig. 8 Induced voltage change δV of the InGaP top subcell for five different illumination powers (open circles). The solid line displays the calculated photovoltage according to Eq. (4).
Fig. 9
Fig. 9 Time dependence of EL intensity upon the ON-OFF switching of IR light irradiation.

Equations (6)

Equations on this page are rendered with MathJax. Learn more.

I EL n p(0) L,
n p(0) = n p exp(e V app /kT),
ln I EL =C+e V app /kT,
V ph = nkT q ln( J PC A J 0 +1),
J PC =ePη(1R)/ω,
ln I EL =C+e( V app V ph )/kT.
Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.