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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 21, Iss. 12 — Jun. 17, 2013
  • pp: 14466–14473

Traceable terahertz power measurement from 1 THz to 5 THz

Andreas Steiger, Mathias Kehrt, Christian Monte, and Ralf Müller  »View Author Affiliations


Optics Express, Vol. 21, Issue 12, pp. 14466-14473 (2013)
http://dx.doi.org/10.1364/OE.21.014466


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Abstract

The metrology institute in Germany, the Physikalisch-Technische Bundesanstalt (PTB), calibrates the spectral responsivity of THz detectors at 2.52 THz traceable to International System of Units. The Terahertz detector calibration facility is equipped with a standard detector calibrated against a cryogenic radiometer at this frequency. In order to extend this service to a broader spectral range in the THz region a new standard detector was developed. This detector is based on a commercial thermopile detector. Its absorber was modified and characterized by spectroscopic methods with respect to its absorptance and reflectance from 1 THz to 5 THz and at the wavelength of a helium-neon laser in the visible spectral range. This offers the possibility of tracing back the THz power responsivity scale to the more accurate responsivity scale in the visible spectral range and thereby to reduce the uncertainty of detector calibrations in the THz range significantly.

© 2013 OSA

OCIS Codes
(120.3930) Instrumentation, measurement, and metrology : Metrological instrumentation
(120.5630) Instrumentation, measurement, and metrology : Radiometry
(140.3070) Lasers and laser optics : Infrared and far-infrared lasers
(260.3090) Physical optics : Infrared, far
(040.2235) Detectors : Far infrared or terahertz

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: April 19, 2013
Revised Manuscript: May 23, 2013
Manuscript Accepted: May 27, 2013
Published: June 10, 2013

Citation
Andreas Steiger, Mathias Kehrt, Christian Monte, and Ralf Müller, "Traceable terahertz power measurement from 1 THz to 5 THz," Opt. Express 21, 14466-14473 (2013)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-21-12-14466


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References

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