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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 21, Iss. 14 — Jul. 15, 2013
  • pp: 16431–16443

Probing timescales during back side ablation of Molybdenum thin films with optical and electrical measurement techniques

D. Bartl, M. Ametowobla, F. Schmid, A. Letsch, M. Hafner, S. Nolte, and A. Tünnermann  »View Author Affiliations


Optics Express, Vol. 21, Issue 14, pp. 16431-16443 (2013)
http://dx.doi.org/10.1364/OE.21.016431


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Abstract

In this study we present a new measurement technique to investigate the timescales of back side ablation of conductive films, using Molybdenum as an application example from photovoltaics. With ultrashort laser pulses at fluences below 0.6 J/cm2, we ablate the Mo film in the shape of a fully intact Mo ’disc’ from a transparent substrate. By monitoring the time-dependent current flow across a specifically developed test structure, we determine the time required for the lift-off of the disc. This value decreases with increasing laser fluence down to a minimum of 21 ± 2 ns. Furthermore, we record trajectories of the discs using a shadowgraphic setup. Ablated discs escape with a maximum velocity of 150 ± 5 m/s whereas droplets of Mo forming at the center of the disc can reach velocities up to 710 ± 11 m/s.

© 2013 OSA

OCIS Codes
(310.3840) Thin films : Materials and process characterization
(320.7090) Ultrafast optics : Ultrafast lasers
(350.3390) Other areas of optics : Laser materials processing
(350.6050) Other areas of optics : Solar energy

ToC Category:
Thin Films

History
Original Manuscript: April 22, 2013
Revised Manuscript: May 28, 2013
Manuscript Accepted: May 28, 2013
Published: July 2, 2013

Citation
D. Bartl, M. Ametowobla, F. Schmid, A. Letsch, M. Hafner, S. Nolte, and A. Tünnermann, "Probing timescales during back side ablation of Molybdenum thin films with optical and electrical measurement techniques," Opt. Express 21, 16431-16443 (2013)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-21-14-16431


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