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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 21, Iss. 16 — Aug. 12, 2013
  • pp: 18777–18796

Applicability analysis of wavelet-transform profilometry

Zibang Zhang and Jingang Zhong  »View Author Affiliations

Optics Express, Vol. 21, Issue 16, pp. 18777-18796 (2013)

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The applicability of the wavelet-transform profilometry is examined in detail. The wavelet-ridge-based phase demodulation is an integral operation of the fringe signal in the spatial domain. The accuracy of the phase demodulation is related to the local linearity of the phase modulated by the object surface. We present a more robust applicability condition which is based on the evaluation of the local linearity. Since high carrier frequency leads to the phase demodulation integral in a narrow interval and the narrow interval results in the high local linearity of modulated phase, we propose to increase the carrier fringe frequency to improve the applicability of the wavelet-transform profilometry and the measurement accuracy. The numerical simulations and the experiment are presented.

© 2013 OSA

OCIS Codes
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.2830) Instrumentation, measurement, and metrology : Height measurements
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.5050) Instrumentation, measurement, and metrology : Phase measurement

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: June 10, 2013
Revised Manuscript: July 22, 2013
Manuscript Accepted: July 24, 2013
Published: July 31, 2013

Zibang Zhang and Jingang Zhong, "Applicability analysis of wavelet-transform profilometry," Opt. Express 21, 18777-18796 (2013)

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