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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 21, Iss. 16 — Aug. 12, 2013
  • pp: 19261–19268

Conductive optical-fiber STM probe for local excitation and collection of cathodoluminescence at semiconductor surfaces

Kentaro Watanabe, Yoshiaki Nakamura, and Masakazu Ichikawa  »View Author Affiliations


Optics Express, Vol. 21, Issue 16, pp. 19261-19268 (2013)
http://dx.doi.org/10.1364/OE.21.019261


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Abstract

Luminescence imaging of semiconductor surfaces in nanometric resolution is a key to novel optoelectronic nano-devices, which requires local carrier excitation and local luminescence collection within the nanometric areas at the surfaces. However, there have not been a practical nanospectroscopies applicable to wide range of specimens. STM-cathodoluminescence (STM-CL) nanospectroscopy offers both high spatial resolution (of the order of 10 nm) and novel high carrier excitation power (up to ~1 mW), which enables local luminescence imaging of less-luminescent nano-structures. In this study, we advanced STM-CL technique by introducing a novel optical fiber probe with Cr thin film coating (Cr-FP), which was found to work as a STM probe, as an electron field-emitter for local carrier excitation, and as an alignment-free efficient local STM-CL collector which blinds luminescence after the minority carrier diffusion.

© 2013 OSA

OCIS Codes
(120.4570) Instrumentation, measurement, and metrology : Optical design of instruments
(160.6000) Materials : Semiconductor materials
(180.5810) Microscopy : Scanning microscopy
(250.1500) Optoelectronics : Cathodoluminescence
(350.3950) Other areas of optics : Micro-optics
(310.7005) Thin films : Transparent conductive coatings

ToC Category:
Microscopy

History
Original Manuscript: April 4, 2013
Revised Manuscript: June 14, 2013
Manuscript Accepted: July 12, 2013
Published: August 6, 2013

Citation
Kentaro Watanabe, Yoshiaki Nakamura, and Masakazu Ichikawa, "Conductive optical-fiber STM probe for local excitation and collection of cathodoluminescence at semiconductor surfaces," Opt. Express 21, 19261-19268 (2013)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-21-16-19261


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