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Multi-beam confocal microscopy based on a custom image sensor with focal-plane pinhole array effect |
Optics Express, Vol. 21, Issue 2, pp. 1417-1429 (2013)
http://dx.doi.org/10.1364/OE.21.001417
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Abstract
Multi-beam confocal microscopy without any physical pinhole was demonstrated. As a key device, a custom CMOS image sensor realizing a focal-plane pinhole array effect by special pixel addressing and discarding of the unwanted photocarriers was developed. The axial resolution in the confocal mode measured by FWHM for a planar mirror was 8.9 μm, which showed that the confocality has been achieved with the proposed CMOS image sensor.
© 2013 OSA
OCIS Codes
(040.1240) Detectors : Arrays
(180.1790) Microscopy : Confocal microscopy
ToC Category:
Microscopy
History
Original Manuscript: October 31, 2012
Revised Manuscript: December 28, 2012
Manuscript Accepted: January 4, 2013
Published: January 14, 2013
Virtual Issues
Vol. 8, Iss. 2 Virtual Journal for Biomedical Optics
Citation
Keiichiro Kagawa, Min-Woong Seo, Keita Yasutomi, Susumu Terakawa, and Shoji Kawahito, "Multi-beam confocal microscopy based on a custom image sensor with focal-plane pinhole array effect," Opt. Express 21, 1417-1429 (2013)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-21-2-1417
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