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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 21, Iss. 2 — Jan. 28, 2013
  • pp: 1417–1429

Multi-beam confocal microscopy based on a custom image sensor with focal-plane pinhole array effect

Keiichiro Kagawa, Min-Woong Seo, Keita Yasutomi, Susumu Terakawa, and Shoji Kawahito  »View Author Affiliations

Optics Express, Vol. 21, Issue 2, pp. 1417-1429 (2013)

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Multi-beam confocal microscopy without any physical pinhole was demonstrated. As a key device, a custom CMOS image sensor realizing a focal-plane pinhole array effect by special pixel addressing and discarding of the unwanted photocarriers was developed. The axial resolution in the confocal mode measured by FWHM for a planar mirror was 8.9 μm, which showed that the confocality has been achieved with the proposed CMOS image sensor.

© 2013 OSA

OCIS Codes
(040.1240) Detectors : Arrays
(180.1790) Microscopy : Confocal microscopy

ToC Category:

Original Manuscript: October 31, 2012
Revised Manuscript: December 28, 2012
Manuscript Accepted: January 4, 2013
Published: January 14, 2013

Virtual Issues
Vol. 8, Iss. 2 Virtual Journal for Biomedical Optics

Keiichiro Kagawa, Min-Woong Seo, Keita Yasutomi, Susumu Terakawa, and Shoji Kawahito, "Multi-beam confocal microscopy based on a custom image sensor with focal-plane pinhole array effect," Opt. Express 21, 1417-1429 (2013)

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