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Optimization of the electroluminescence from SiNx-based light-emitting devices by modulating the size and morphology of silver nanostructuresFeng Wang, Dongsheng Li, Lu Jin, Changrui Ren, Deren Yang, and Duanlin Que »View Author Affiliations
Feng Wang,
Dongsheng Li,*
Lu Jin,
Changrui Ren,
Deren Yang,
and Duanlin Que
State Key Laboratory of Silicon Materials and Department of Materials Science and Engineering, Zhejiang University, Hangzhou 310027, China *Corresponding author: mselds@zju.edu.cn |
Optics Express, Vol. 21, Issue 2, pp. 1675-1686 (2013)
http://dx.doi.org/10.1364/OE.21.001675
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Abstract
A maximal enhancement of ~6.5 times of the external quantum efficiency (EQE) for SiNx-based light-emitting devices (LEDs) is achieved by magnetron sputtering a silver nanostructures layer onto the active matrix. The enhancement of EQE is affected by the dimension and morphology of silver nanostructures, which can be controlled by the sputtering time and the post treatment of rapid thermal annealing. The optimal size of silver nanostructures is about 100 nm in diameter by comparing the integrated electroluminescence intensity under the same input power. The optimization of EQE for SiNx-based LEDs is discussed by considering the contributions of the enhancement of light-extraction efficiency induced by the surface roughening of the front electrode, internal quantum efficiency due to the coupling between excitons and localized surface plasmons, and carrier injection efficiency. Our work may provide an alternative approach for the fabrication of Si-based light sources with promising luminescence efficiency.
© 2013 OSA
OCIS Codes
(160.3130) Materials : Integrated optics materials
(230.2090) Optical devices : Electro-optical devices
(250.5403) Optoelectronics : Plasmonics
ToC Category:
Optical Devices
History
Original Manuscript: July 17, 2012
Revised Manuscript: January 3, 2013
Manuscript Accepted: January 9, 2013
Published: January 16, 2013
Citation
Feng Wang, Dongsheng Li, Lu Jin, Changrui Ren, Deren Yang, and Duanlin Que, "Optimization of the electroluminescence from SiNx-based light-emitting devices by modulating the size and morphology of silver nanostructures," Opt. Express 21, 1675-1686 (2013)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-21-2-1675
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- C. Huh, K.-H. Kim, B. K. Kim, W. Kim, H. Ko, C.-J. Choi, and G. Y. Sung, “Enhancement in light emission efficiency of a silicon nanocrystal light-emitting diode by multiple-luminescent structures,” Adv. Mater. (Deerfield Beach Fla.)22(44), 5058–5062 (2010). [CrossRef] [PubMed]
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- T. F. Kuech and L. J. Mawst, “Nanofabrication of III–V semiconductors employing diblock copolymer lithography,” J. Phys. D Appl. Phys.43(18), 183001 (2010). [CrossRef]
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- Y. K. Ee, P. Kumnorkaew, R. A. Arif, H. Tong, J. F. Gilchrist, and N. Tansu, “Light extraction efficiency enhancement of InGaN quantum wells light-emitting diodes with polydimethylsiloxane concave microstructures,” Opt. Express17(16), 13747–13757 (2009). [CrossRef] [PubMed]
- Y.-K. Ee, R. A. Arif, N. Tansu, P. Kumnorkaew, and J. F. Gilchrist, “Enhancement of light extraction efficiency of InGaN quantum wells light emitting diodes using SiO2/polystyrene microlens arrays,” Appl. Phys. Lett.91(22), 221107 (2007). [CrossRef]
- B.-H. Kim, C.-H. Cho, J.-S. Mun, M.-K. Kwon, T.-Y. Park, J.-S. Kim, C.-C. Byeon, J. Lee, and S.-J. Park, “Enhancement of the external quantum efficiency of a silicon quantum dot light-emitting diode by localized surface plasmons,” Adv. Mater. (Deerfield Beach Fla.)20(16), 3100–3104 (2008). [CrossRef]
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- W. L. Barnes, A. Dereux, and T. W. Ebbesen, “Surface plasmon subwavelength optics,” Nature424(6950), 824–830 (2003). [CrossRef] [PubMed]
- N.-M. Park, C.-J. Choi, T.-Y. Seong, and S.-J. Park, “Quantum confinement in amorphous silicon quantum dots embedded in silicon nitride,” Phys. Rev. Lett.86(7), 1355–1357 (2001). [CrossRef] [PubMed]
- G. Aberle, “Surface passivation of crystalline silicon solar cells: a review,” Prog. Photovolt. Res. Appl.8(5), 473–487 (2000). [CrossRef]
- R. T. Tung, “Electron transport at metal-semiconductor interfaces: General theory,” Phys. Rev. B Condens. Matter45(23), 13509–13523 (1992). [CrossRef] [PubMed]
- H. J. Stein, “Thermally annealed silicon nitride films: Electrical characteristics and radiation effects,” J. Appl. Phys.57(6), 2040–2047 (1985). [CrossRef]
- J. Robertson and M. J. Powell, “Gap states in silicon-nitride,” Appl. Phys. Lett.44(4), 415–417 (1984). [CrossRef]
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