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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 21, Iss. 2 — Jan. 28, 2013
  • pp: 2032–2049

Phase optimisation for structured illumination microscopy

Kai Wicker, Ondrej Mandula, Gerrit Best, Reto Fiolka, and Rainer Heintzmann  »View Author Affiliations

Optics Express, Vol. 21, Issue 2, pp. 2032-2049 (2013)

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Structured illumination microscopy can achieve super-resolution in fluorescence imaging. The sample is illuminated with periodic light patterns, and a series of images are acquired for different pattern positions, also called phases. From these a super-resolution image can be computed. However, for an artefact-free reconstruction it is important that the pattern phases be known with very high precision. If the necessary precision cannot be guaranteed experimentally, the phase information has to be retrieved a posteriori from the acquired data. We present a fast and robust algorithm that iteratively determines these phases with a precision of typically below λ/100. Our method, which is based on cross-correlations, allows optimisation of pattern phase even when the pattern itself is too fine for detection, in which case most other methods inevitably fail. We analyse the performance of this method using simulated data from a synthetic 2D sample as well as experimental single-slice data from a 3D sample and compare it with another previously published approach.

© 2013 OSA

OCIS Codes
(100.2000) Image processing : Digital image processing
(100.6640) Image processing : Superresolution
(180.2520) Microscopy : Fluorescence microscopy

ToC Category:

Original Manuscript: September 28, 2012
Revised Manuscript: January 6, 2013
Manuscript Accepted: January 7, 2013
Published: January 18, 2013

Virtual Issues
Vol. 8, Iss. 2 Virtual Journal for Biomedical Optics

Kai Wicker, Ondrej Mandula, Gerrit Best, Reto Fiolka, and Rainer Heintzmann, "Phase optimisation for structured illumination microscopy," Opt. Express 21, 2032-2049 (2013)

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