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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 21, Iss. 20 — Oct. 7, 2013
  • pp: 23145–23159

Characterization and reduction of spectral distortions in Silicon-on-Insulator integrated Bragg gratings

Alexandre D. Simard, Guillaume Beaudin, Vincent Aimez, Yves Painchaud, and Sophie LaRochelle  »View Author Affiliations


Optics Express, Vol. 21, Issue 20, pp. 23145-23159 (2013)
http://dx.doi.org/10.1364/OE.21.023145


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Abstract

A major issue in the fabrication of integrated Bragg grating filters in highly confined waveguides is the average effective index fluctuations caused by waveguide dimension variations. Lateral variations are caused by the sidewall roughness created during the etching process while vertical variations are coming from the wafer silicon layer thickness non-uniformity. Grating spectral distortions are known to result solely from the low spatial frequency components of these variations. As a result, in this work, we present an experimental method to quantify such relevant spatial components by stitching a hundred high-resolution scanning electron microscope images. Additionally, we propose two techniques to reduce, in the design, the phase noise impact on integrated Bragg gratings without relying on fabrication process improvements. More specifically, we show that the use of hybrid multimode/singlemode waveguides reduce by more than one order of magnitude the effect of sidewall roughness on integrated Bragg gratings while we show that the fabrication of ultra-compact gratings in spiral waveguides mitigate the impact of the silicon layer thickness variations.

© 2013 OSA

OCIS Codes
(050.2770) Diffraction and gratings : Gratings
(130.3120) Integrated optics : Integrated optics devices
(140.4780) Lasers and laser optics : Optical resonators
(130.7408) Integrated optics : Wavelength filtering devices

ToC Category:
Integrated Optics

History
Original Manuscript: July 3, 2013
Revised Manuscript: September 11, 2013
Manuscript Accepted: September 12, 2013
Published: September 24, 2013

Citation
Alexandre D. Simard, Guillaume Beaudin, Vincent Aimez, Yves Painchaud, and Sophie LaRochelle, "Characterization and reduction of spectral distortions in Silicon-on-Insulator integrated Bragg gratings," Opt. Express 21, 23145-23159 (2013)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-21-20-23145


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