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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 21, Iss. 20 — Oct. 7, 2013
  • pp: 23331–23344

A full ellipsometric approach to optical sensing with Bloch surface waves on photonic crystals

Alberto Sinibaldi, Riccardo Rizzo, Giovanni Figliozzi, Emiliano Descrovi, Norbert Danz, Peter Munzert, Aleksei Anopchenko, and Francesco Michelotti  »View Author Affiliations

Optics Express, Vol. 21, Issue 20, pp. 23331-23344 (2013)

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We report on the investigation on the resolution of optical sensors exploiting Bloch surface waves sustained by one dimensional photonic crystals. A figure of merit is introduced to quantitatively assess the performance of such sensors and its dependency on the geometry and materials of the photonic crystal. We show that the figure of merit and the resolution can be improved by adopting a full ellipsometric phase-sensitive approach. The theoretical predictions are confirmed by experiments in which, for the first time, such type of sensors are operated in the full ellipsometric scheme.

© 2013 OSA

OCIS Codes
(130.6010) Integrated optics : Sensors
(170.4580) Medical optics and biotechnology : Optical diagnostics for medicine
(240.6690) Optics at surfaces : Surface waves
(160.5293) Materials : Photonic bandgap materials
(050.5298) Diffraction and gratings : Photonic crystals
(230.5298) Optical devices : Photonic crystals
(310.5448) Thin films : Polarization, other optical properties

ToC Category:

Original Manuscript: May 21, 2013
Revised Manuscript: August 19, 2013
Manuscript Accepted: August 31, 2013
Published: September 25, 2013

Alberto Sinibaldi, Riccardo Rizzo, Giovanni Figliozzi, Emiliano Descrovi, Norbert Danz, Peter Munzert, Aleksei Anopchenko, and Francesco Michelotti, "A full ellipsometric approach to optical sensing with Bloch surface waves on photonic crystals," Opt. Express 21, 23331-23344 (2013)

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