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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 21, Iss. 20 — Oct. 7, 2013
  • pp: 23963–23977

Three-beam interference with circular polarization for structured illumination microscopy

Hsiao-Chih Huang, Bo-Jui Chang, Li-Jun Chou, and Su-Yu Chiang  »View Author Affiliations


Optics Express, Vol. 21, Issue 20, pp. 23963-23977 (2013)
http://dx.doi.org/10.1364/OE.21.023963


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Abstract

Three-dimensional structured illumination microscopy (3D-SIM) is a wide-field technique that can provide doubled resolution and improved image contrast. In this work, we demonstrate a simple approach to 3D-SIM − using three-beam interference with circular polarization to generate the pattern of structured illumination, so that the modulation contrast is routinely maintained at all orientations without a complicated polarization rotator or mechanical motion. We derive the resultant intensity distribution of the interference pattern to confirm the modulation contrast independent of orientation, and compare the result with those using interfering beams of linear polarization. To evaluate the influence of the modulation contrast on imaging, we compare the simulated SIM images of 100-nm beads. Experimental results are presented to confirm the simulations. Our approach requires merely a λ/4-wave plate to alter the interfering beams from linear to circular polarization. This simplicity together with the use of a spatial light modulator to control the interference pattern facilitates the implementation of a 3D-SIM system and should broaden its application.

© 2013 OSA

OCIS Codes
(100.6640) Image processing : Superresolution
(180.0180) Microscopy : Microscopy
(260.5430) Physical optics : Polarization

ToC Category:
Microscopy

History
Original Manuscript: June 19, 2013
Revised Manuscript: August 8, 2013
Manuscript Accepted: September 9, 2013
Published: October 1, 2013

Citation
Hsiao-Chih Huang, Bo-Jui Chang, Li-Jun Chou, and Su-Yu Chiang, "Three-beam interference with circular polarization for structured illumination microscopy," Opt. Express 21, 23963-23977 (2013)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-21-20-23963


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