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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 21, Iss. 22 — Nov. 4, 2013
  • pp: 26398–26417

Synthetic phase-shifting for optical testing: Point-diffraction interferometry without null optics or phase shifters

Ryeojin Park, Dae Wook Kim, and Harrison H. Barrett  »View Author Affiliations


Optics Express, Vol. 21, Issue 22, pp. 26398-26417 (2013)
http://dx.doi.org/10.1364/OE.21.026398


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Abstract

An innovative iterative search method called the synthetic phase-shifting (SPS) algorithm is proposed. This search algorithm is used for maximum-likelihood (ML) estimation of a wavefront that is described by a finite set of Zernike Fringe polynomials. In this paper, we estimate the coefficient, or parameter, values of the wavefront using a single interferogram obtained from a point-diffraction interferometer (PDI). In order to find the estimates, we first calculate the squared-difference between the measured and simulated interferograms. Under certain assumptions, this squared-difference image can be treated as an interferogram showing the phase difference between the true wavefront deviation and simulated wavefront deviation. The wavefront deviation is the difference between the reference and the test wavefronts. We calculate the phase difference using a traditional phase-shifting technique without physical phase-shifters. We present a detailed forward model for the PDI interferogram, including the effect of the finite size of a detector pixel. The algorithm was validated with computational studies and its performance and constraints are discussed. A prototype PDI was built and the algorithm was also experimentally validated. A large wavefront deviation was successfully estimated without using null optics or physical phase-shifters. The experimental result shows that the proposed algorithm has great potential to provide an accurate tool for non-null testing.

© 2013 Optical Society of America

OCIS Codes
(100.2650) Image processing : Fringe analysis
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(110.3175) Imaging systems : Interferometric imaging

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: July 1, 2013
Revised Manuscript: October 13, 2013
Manuscript Accepted: October 21, 2013
Published: October 28, 2013

Citation
Ryeojin Park, Dae Wook Kim, and Harrison H. Barrett, "Synthetic phase-shifting for optical testing: Point-diffraction interferometry without null optics or phase shifters," Opt. Express 21, 26398-26417 (2013)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-21-22-26398


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