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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 21, Iss. 22 — Nov. 4, 2013
  • pp: 26735–26741

Combined cavity ring-down and spectrophotometry for measuring reflectance of optical laser components

Hongyu Zu, Bincheng Li, Yanling Han, and Lifeng Gao  »View Author Affiliations


Optics Express, Vol. 21, Issue 22, pp. 26735-26741 (2013)
http://dx.doi.org/10.1364/OE.21.026735


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Abstract

A combined cavity ring-down (CRD) and spectrophotometry technique is developed to measure with sufficiently high accuracy the reflectance of any practically fabricated optical laser component with reflectance ranging from below 0.01% to over 99.999%. In this combined technique, a CRD configuration is employed to measure reflectance higher than 99%, and a conventional spectrophotometric configuration, which is formed by simply removing the rear cavity mirror from the CRD configuration, is applied to measure reflectance below 99%. Uncertainties below 0.0001% for reflectance over 99.99% and below 0.3% for reflectance below 99% are experimentally achieved with CRD and spectrophotometry configurations, respectively, of one single experimental setup.

© 2013 Optical Society of America

OCIS Codes
(310.0310) Thin films : Thin films
(310.6860) Thin films : Thin films, optical properties

ToC Category:
Thin Films

History
Original Manuscript: September 3, 2013
Revised Manuscript: October 14, 2013
Manuscript Accepted: October 14, 2013
Published: October 29, 2013

Citation
Hongyu Zu, Bincheng Li, Yanling Han, and Lifeng Gao, "Combined cavity ring-down and spectrophotometry for measuring reflectance of optical laser components," Opt. Express 21, 26735-26741 (2013)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-21-22-26735


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References

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