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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 21, Iss. 22 — Nov. 4, 2013
  • pp: 27209–27218

Fano resonances in integrated silicon Bragg reflectors for sensing applications

Chia-Ming Chang and Olav Solgaard  »View Author Affiliations


Optics Express, Vol. 21, Issue 22, pp. 27209-27218 (2013)
http://dx.doi.org/10.1364/OE.21.027209


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Abstract

We investigate theoretically and experimentally Fano resonances in integrated silicon Bragg reflectors. These asymmetric resonances are obtained by interference between light reflected from the Bragg waveguide and from the end facet. The Bragg reflectors were designed and modeled using the 1D transfer matrix method, and they were fabricated in standard silicon wafers using a CMOS-compatible process. The results show that the shape and asymmetry of the Fano resonances depend on the relative phase of the reflected light from the Bragg reflectors and end facet. This phase relationship can be controlled to optimize the lineshapes for sensing applications. Temperature sensing in these integrated Bragg reflectors are experimentally demonstrated with a temperature sensitivity of 77pm/°C based on the thermo-optic effect of silicon.

© 2013 Optical Society of America

OCIS Codes
(230.1480) Optical devices : Bragg reflectors
(230.3120) Optical devices : Integrated optics devices
(230.7370) Optical devices : Waveguides

ToC Category:
Integrated Optics

History
Original Manuscript: August 29, 2013
Revised Manuscript: October 22, 2013
Manuscript Accepted: October 23, 2013
Published: November 1, 2013

Citation
Chia-Ming Chang and Olav Solgaard, "Fano resonances in integrated silicon Bragg reflectors for sensing applications," Opt. Express 21, 27209-27218 (2013)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-21-22-27209


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