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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 21, Iss. 23 — Nov. 18, 2013
  • pp: 27796–27801

Ultrasensitive refractive index sensor based on the resonant scattering effect between double air circular-holes on silicon waveguides

Jun Song, Bojun Li, Linchun Chen, and Xuan Li  »View Author Affiliations

Optics Express, Vol. 21, Issue 23, pp. 27796-27801 (2013)

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Recently, we have proposed a sensitive refractive index sensor design by integrating a circular-hole defect with an etched diffraction grating (EDG) spectrometer based on amorphous silicon photonic platforms. In the present paper, we will show that a much better sensitivity (~17422 nm/RIU) can be obtained by using double circular-holes with an appropriate interval. The influence of the double-hole interval on the performance of sensing applications is also characterized. A sinusoidal pattern of the sensitivity can be found as the interval increases. However, the intensity of the resonant peak (i.e., the detectability for sensing applications) significantly oscillates as the interval varies.

© 2013 Optical Society of America

OCIS Codes
(130.3120) Integrated optics : Integrated optics devices
(130.6010) Integrated optics : Sensors

ToC Category:
Integrated Optics

Original Manuscript: September 23, 2013
Revised Manuscript: October 24, 2013
Manuscript Accepted: October 26, 2013
Published: November 5, 2013

Jun Song, Bojun Li, Linchun Chen, and Xuan Li, "Ultrasensitive refractive index sensor based on the resonant scattering effect between double air circular-holes on silicon waveguides," Opt. Express 21, 27796-27801 (2013)

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