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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 21, Iss. 23 — Nov. 18, 2013
  • pp: 28019–28028

Using coherent X-ray ptychography to probe medium-range order

A. T. J. Torrance, B. Abbey, C. T. Putkunz, D. Pelliccia, E. Balaur, G. J. Williams, D. J. Vine, A. Y. Nikulin, I. McNulty, H. M. Quiney, and K. A. Nugent  »View Author Affiliations

Optics Express, Vol. 21, Issue 23, pp. 28019-28028 (2013)

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Characterization of microscopic structural order and in particular medium range order (MRO) in amorphous materials is challenging. A new technique is demonstrated that allows analysis of MRO using X-rays. Diffraction data were collected from a sample consisting of densely packed polystyrene-latex micro-spheres. Ptychography is used to reconstruct the sample transmission function and fluctuation microscopy applied to characterize structural order producing a detailed `fluctuation map' allowing analysis of the sample at two distinct length scales. Independent verification is provided via X-ray diffractometry. Simulations of dense random packing of spheres have also been used to explore the origin of the structural order measured.

© 2013 Optical Society of America

OCIS Codes
(160.2750) Materials : Glass and other amorphous materials
(180.7460) Microscopy : X-ray microscopy

ToC Category:

Original Manuscript: September 9, 2013
Revised Manuscript: October 26, 2013
Manuscript Accepted: October 28, 2013
Published: November 7, 2013

Virtual Issues
Vol. 9, Iss. 1 Virtual Journal for Biomedical Optics

A. T. J. Torrance, B. Abbey, C. T. Putkunz, D. Pelliccia, E. Balaur, G. J. Williams, D. J. Vine, A. Y. Nikulin, I. McNulty, H. M. Quiney, and K. A. Nugent, "Using coherent X-ray ptychography to probe medium-range order," Opt. Express 21, 28019-28028 (2013)

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  1. S. R. Elliott, “The structure of amorphous hydrogenated silicon and its alloys: A review,” Adv. Phys.38(1), 1–88 (1989). [CrossRef]
  2. L. Fan, I. McNulty, D. Paterson, M. M. J. Treacy, and J. M. Gibson, “Fluctuation microscopy – a tool for examining medium-range order in noncrystalline systems,” Nucl. Instrum. Methods B238(1–4), 196–199 (2005). [CrossRef]
  3. W. D. Luedtke and U. Landman, “Preparation, structure, dynamics, and energetics of amorphous silicon: A molecular-dynamics study,” Phys. Rev. B Condens. Matter40(2), 1164–1174 (1989). [CrossRef] [PubMed]
  4. P. M. Voyles and J. R. Abelson, “Medium-range order in amorphous silicon measured by fluctuation electron microscopy,” Sol. Energy Mater. Sol. Cells78(1–4), 85–113 (2003). [CrossRef]
  5. S. R. Elliott, “The origin of the first sharp diffraction peak in the structure factor of covalent glasses and liquids,” J. Phys. Condens. Matter4, 7661 (1992).
  6. S. Muthmann, F. Köhler, R. Carius, and A. Gordijn, “Structural order on different length scales in amorphous silicon investigated by Raman spectroscopy,” Phys. Status Solidi A207(3), 544–547 (2010). [CrossRef]
  7. J. J. Turner, X. Huang, O. Krupin, K. A. Seu, D. Parks, S. Kevan, E. Lima, K. Kisslinger, I. McNulty, R. Gambino, S. Mangin, S. Roy, and P. Fischer, “X-ray diffraction microscopy of magnetic structures,” Phys. Rev. Lett.107(3), 033904 (2011). [CrossRef] [PubMed]
  8. P. Wochner, C. Gutt, T. Autenrieth, T. Demmer, V. Bugaev, A. D. Ortiz, A. Duri, F. Zontone, G. Grübel, and H. Dosch, “X-ray cross correlation analysis uncovers hidden local symmetries in disordered matter,” Proc. Natl. Acad. Sci. U.S.A.106(28), 11511–11514 (2009). [CrossRef] [PubMed]
  9. M. Treacy, J. Gibson, L. Fan, D. Paterson, and I. McNulty, “Fluctuation microscopy: a probe of medium range order,” Rep. Prog. Phys.68(12), 2899–2944 (2005). [CrossRef]
  10. M. Treacy and J. Gibson, “Variable coherence microscopy: a rich source of structural information from disordered materials,” Acta. Crystallogr., Sect. A52(2), 212–220 (1996). [CrossRef]
  11. M. Treacy, J. Gibson, and P. Keblinski, “Paracrystallites found in evaporated amorphous tetrahedral semiconductors,” J. Non-Cryst. Solids231(1–2), 99–110 (1998). [CrossRef]
  12. J. Gibson and M. Treacy, “Diminished medium-range order observed in annealed amorphous germanium,” Phys. Rev. Lett.78(6), 1074–1077 (1997). [CrossRef]
  13. J. Gibson, M. Treacy, P. Voyles, H. Jin, and J. Abelson, “Structural disorder induced in hydrogenated amorphous silicon by light soaking,” Appl. Phys. Lett.73(21), 3093–3095 (1998). [CrossRef]
  14. P. Gerbi, M. Voyles, M. M. J. Treacy, J. M. Gibson, and J. R. Abelson, “Increasing medium-range order in amorphous silicon with low-energy ion bombardment,” Appl. Phys. Lett.82(21), 3665–3667 (2003). [CrossRef]
  15. L. Fan, D. Paterson, I. McNulty, M. M. Treacy, and J. M. Gibson, “Fluctuation X-ray microscopy: a novel approach for the structural study of disordered materials,” J. Microsc.225(1), 41–48 (2007). [CrossRef] [PubMed]
  16. G. I. Márk, Z. Vértesy, K. Kertész, Z. Bálint, and L. P. Biró, “Order-disorder effects in structure and color relation of photonic-crystal-type nanostructures in butterfly wing scales,” Phys. Rev. E Stat. Nonlinear Soft Matter Phys.80(5), 051903 (2009). [CrossRef] [PubMed]
  17. H. Noh, S. F. Liew, V. Saranathan, R. O. Prum, E. R. Dufresne, S. G. Mochrie, and H. Cao, “Double scattering of light from biophotonic nanostructures with short-range order,” Quantum Electronics and Laser Science Conference (Optical Society of America, 2010). [CrossRef]
  18. I. Tamáska, G. Dobrik, P. Nemes-Incze, K. Kertész, E. Horváth, G. Márk, T. Jászi, P. Neumann, Z. Horváth, and L. Biró, “Bioinspired photonic nanoarchitectures from graphitic thin films,” Thin Solid Films519(12), 4078–4081 (2011). [CrossRef]
  19. Y. Takahashi, Y. Nishino, T. Ishikawa, and E. Matsubara, “Approach for three-dimensional observation of mesoscopic precipitates in alloys by coherent x-ray diffraction microscopy,” Appl. Phys. Lett.90(18), 184105 (2007). [CrossRef]
  20. J. H. Chen, E. Costan, M. A. van Huis, Q. Xu, and H. W. Zandbergen, “Atomic pillar-based nanoprecipitates strengthen AlMgSi alloys,” Science312(5772), 416–419 (2006). [CrossRef] [PubMed]
  21. J. M. Rodenburg and H. M. Faulkner, “A phase retrieval algorithm for shifting illumination,” Appl. Phys. Lett.85(20), 4795–4797 (2004). [CrossRef]
  22. S. N. Bogle, L. N. Nittala, R. D. Twesten, P. M. Voyles, and J. R. Abelson, “Size analysis of nanoscale order in amorphous materials by variable-resolution fluctuation electron microscopy,” Ultramicroscopy110(10), 1273–1278 (2010). [CrossRef]
  23. J. Hwang and P. M. Voyles, “Variable resolution fluctuation electron microscopy on Cu-Zr metallic glass using a wide range of coherent stem probe size,” Microsc. Microanal.17(1), 67–74 (2011). [CrossRef] [PubMed]
  24. J. M. Cowley, “Electron nanodiffraction methods for measuring medium-range order,” Ultramicroscopy90(2–3), 197–206 (2002). [CrossRef] [PubMed]
  25. J. Gibson and M. Treacy, “Defocus as an ineffective means of changing spot size for fluctuation microscopy,” J. Phys. Conf. Ser.186(1), 012053 (2009).
  26. R. Hegerl and W. Hoppe, “Dynamic theory of crystalline structure analysis by electron diffraction in inhomogeneous primary wave field,” Ber. Bunsenges. Phys. Chem74(11), 1148 (1970). [CrossRef]
  27. H. N. Chapman, “Phase-retrieval X-ray microscopy by Wigner-distribution deconvolution,” Ultramicroscopy66(3–4), 153–172 (1996). [CrossRef]
  28. J. M. Rodenburg, A. C. Hurst, A. G. Cullis, B. R. Dobson, F. Pfeiffer, O. Bunk, C. David, K. Jefimovs, and I. Johnson, “Hard-x-ray lensless imaging of extended objects,” Phys. Rev. Lett.98(3), 034801 (2007). [CrossRef] [PubMed]
  29. B. Abbey, K. A. Nugent, G. J. Williams, J. N. Clark, A. G. Peele, M. A. Pfeifer, M. De Jonge, and I. McNulty, “Keyhole coherent diffractive imaging,” Nat. Phys.4(5), 394–398 (2008). [CrossRef]
  30. C. T. Putkunz, J. N. Clark, D. J. Vine, G. J. Williams, E. Balaur, G. A. Cadenazzi, E. K. Curwood, C. A. Henderson, R. E. Scholten, R. J. Stewart, I. McNulty, K. A. Nugent, and A. G. Peele, “Mapping granular structure in the biological adhesive of Phragmatopoma californica using phase diverse coherent diffractive imaging,” Ultramicroscopy111(8), 1184–1188 (2011). [CrossRef] [PubMed]
  31. C. T. Putkunz, J. N. Clark, D. J. Vine, G. J. Williams, M. A. Pfeifer, E. Balaur, I. McNulty, K. A. Nugent, and A. G. Peele, “Phase-diverse coherent diffractive imaging: High sensitivity with low dose,” Phys. Rev. Lett.106(1), 013903 (2011). [CrossRef] [PubMed]
  32. J. M. Gibson, M. M. Treacy, and P. M. Voyles, “Atom pair persistence in disordered materials from fluctuation microscopy,” Ultramicroscopy83(3–4), 169–178 (2000). [CrossRef] [PubMed]
  33. G. J. Williams, H. M. Quiney, B. B. Dhal, C. Q. Tran, K. A. Nugent, A. G. Peele, D. Paterson, and M. D. de Jonge, “Fresnel coherent diffractive imaging,” Phys. Rev. Lett.97(2), 025506 (2006). [CrossRef] [PubMed]
  34. H. M. Quiney, A. Peele, Z. Cai, D. Paterson, and K. A. Nugent, “Diffractive imaging of highly focused X-ray fields,” Nat. Phys.2(2), 101–104 (2006). [CrossRef]
  35. M. Skoge, A. Donev, F. H. Stillinger, and S. Torquato, “Packing hyperspheres in high-dimensional Euclidean spaces,” Phys. Rev. E Stat. Nonlinear Soft Matter Phys.74(4), 041127 (2006). [CrossRef] [PubMed]
  36. B. D. Lubachevsky and F. H. Stillinger, “Geometric properties of random disk packings,” J. Stat. Phys.60(5–6), 561–583 (1990). [CrossRef]
  37. A. Nikulin, A. Darahanau, R. Horney, and T. Ishikawa, “High-resolution X-ray diffraction imaging of non-Bragg diffracting materials using phase retrieval X-ray diffractometry (PRXRD) technique,” Physica B349(1–4), 281–295 (2004). [CrossRef]
  38. Y. Jiao, F. H. Stillinger, and S. Torquato, “A superior descriptor of random textures and its predictive capacity,” Proc. Natl. Acad. Sci. U.S.A.106(42), 17634–17639 (2009). [CrossRef] [PubMed]
  39. R. Xie, G. G. Long, S. J. Weigand, S. C. Moss, T. Carvalho, S. Roorda, M. Hejna, S. Torquato, and P. J. Steinhardt, “Hyperuniformity in amorphous silicon based on the measurement of the infinite-wavelength limit of the structure factor,” Proc. Natl. Acad. Sci. U.S.A.110(33), 13250–13254 (2013). [CrossRef] [PubMed]

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