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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 21, Iss. 23 — Nov. 18, 2013
  • pp: 28189–28197

Aberration compensation in aplanatic solid immersion lens microscopy

Yang Lu, Thomas Bifano, Selim Ünlü, and Bennett Goldberg  »View Author Affiliations

Optics Express, Vol. 21, Issue 23, pp. 28189-28197 (2013)

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The imaging quality of an aplanatic SIL microscope is shown to be significantly degraded by aberrations, especially when the samples have thicknesses that are more than a few micrometers thicker or thinner than the design thickness. Aberration due to the sample thickness error is modeled and compared with measurements obtained in a high numerical aperture (NA ~3.5) microscope. A technique to recover near-ideal imaging quality by compensating aberrations using a MEMS deformable mirror is described and demonstrated.

© 2013 Optical Society of America

OCIS Codes
(220.1000) Optical design and fabrication : Aberration compensation
(110.1085) Imaging systems : Adaptive imaging

ToC Category:

Original Manuscript: October 1, 2013
Revised Manuscript: October 31, 2013
Manuscript Accepted: October 31, 2013
Published: November 8, 2013

Virtual Issues
Vol. 9, Iss. 1 Virtual Journal for Biomedical Optics

Yang Lu, Thomas Bifano, Selim Ünlü, and Bennett Goldberg, "Aberration compensation in aplanatic solid immersion lens microscopy," Opt. Express 21, 28189-28197 (2013)

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