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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 21, Iss. 24 — Dec. 2, 2013
  • pp: 29769–29779

Using STED and ELSM confocal microscopy for a better knowledge of fused silica polished glass interface

Rodolphe Catrin, Jérôme Neauport, Philippe Legros, Daniel Taroux, Thomas Corbineau, Philippe Cormont, and Cédric Maunier  »View Author Affiliations


Optics Express, Vol. 21, Issue 24, pp. 29769-29779 (2013)
http://dx.doi.org/10.1364/OE.21.029769


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Abstract

Characteristics and nature of close surface defects existing in fused silica polished optical surfaces were explored. Samples were deliberately scratched using a modified polishing process in presence of different fluorescent dyes. Various techniques including Epi-fluorescence Laser Scanning Mode (ELSM) or STimulated Emission Depletion (STED) confocal microscopy were used to measure and quantify scratches that are sometimes embedded under the polished layer. We show using a non-destructive technique that depth of the modified region extends far below the surface. Moreover cracks of 120 nm width can be present ten micrometers below the surface.

© 2013 Optical Society of America

OCIS Codes
(110.0180) Imaging systems : Microscopy
(140.3330) Lasers and laser optics : Laser damage
(160.2540) Materials : Fluorescent and luminescent materials
(220.5450) Optical design and fabrication : Polishing

ToC Category:
Optical Design and Fabrication

History
Original Manuscript: September 17, 2013
Revised Manuscript: October 29, 2013
Manuscript Accepted: October 31, 2013
Published: November 25, 2013

Virtual Issues
Vol. 9, Iss. 2 Virtual Journal for Biomedical Optics

Citation
Rodolphe Catrin, Jérôme Neauport, Philippe Legros, Daniel Taroux, Thomas Corbineau, Philippe Cormont, and Cédric Maunier, "Using STED and ELSM confocal microscopy for a better knowledge of fused silica polished glass interface," Opt. Express 21, 29769-29779 (2013)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-21-24-29769


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