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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 21, Iss. 26 — Dec. 30, 2013
  • pp: 32358–32370

Electrical heating synchronized with IR imaging to determine thin film defects

Kimmo Leppänen, Juha Saarela, Risto Myllylä, and Tapio Fabritius  »View Author Affiliations

Optics Express, Vol. 21, Issue 26, pp. 32358-32370 (2013)

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Measuring conductive thin film properties during production and in end products is a challenge. The main demands for the measurements are: production control, reliability and functionality in final applications. There are several ways to measure thin film quality in a laboratory environment, however these methods are poorly applicable for production facilities. In order to bypass the limitations of existing methods, a simple synchronized heating and IR-imaging based system was implemented. To demonstrate the proposed method, Indium Tin Oxide (ITO) was selected as an example of conductive thin films. PET-ITO films were bent to obtain samples with defects. The proposed method was used and automated signal processing was developed. The results show that the system developed here is suitable for defining breakage types and localizing defects.

© 2013 Optical Society of America

OCIS Codes
(100.2000) Image processing : Digital image processing
(110.6820) Imaging systems : Thermal imaging
(220.4840) Optical design and fabrication : Testing
(310.3840) Thin films : Materials and process characterization

ToC Category:
Thin Films

Original Manuscript: October 29, 2013
Revised Manuscript: December 13, 2013
Manuscript Accepted: December 13, 2013
Published: December 19, 2013

Kimmo Leppänen, Juha Saarela, Risto Myllylä, and Tapio Fabritius, "Electrical heating synchronized with IR imaging to determine thin film defects," Opt. Express 21, 32358-32370 (2013)

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  1. R. G. Gordon, “Criteria for choosing transparent conductors,” MRS Bull.25(08), 52–57 (2000). [CrossRef]
  2. J. Chae, S. Appasamy, and K. Jain, “Patterning of indium tin oxide by projection photoablation and lift-off process for fabrication of flat-panel displays,” Appl. Phys. Lett.90(26), 261102 (2007). [CrossRef]
  3. L. Yang, T. Zhang, H. Zhou, S. C. Price, B. J. Wiley, and W. You, “Solution-processed flexible polymer solar cells with silver nanowire electrodes,” ACS Appl. Mater. Interfaces3(10), 4075–4084 (2011). [CrossRef] [PubMed]
  4. C. J. M. Emmott, A. Urbina, and J. Nelson, “Environmental and economic assessment of ITO-free electrodes for organic solar cells,” Sol. Energy Mater. Sol. Cells97, 14–21 (2012). [CrossRef]
  5. N. Espinosa, R. García-Valverde, A. Urbina, and F. C. Krebs, “A life cycle analysis of polymer solar cell modules prepared using roll-to-roll methods under ambient conditions,” Sol. Energy Mater. Sol. Cells95(5), 1293–1302 (2011). [CrossRef]
  6. J. C. Li, Y. Wang, and D. C. Ba, “Characterization of semiconductor surface conductivity by using microscopic four-point technique,” Phys. Procedia32, 347–355 (2012). [CrossRef]
  7. K. Alzoubi, M. M. Hamasha, S. Lu, and B. Sammakia, “Bending fatigue study of sputtered ITO on flexible substrate,” J. Disp. Technol.7(11), 593–600 (2011). [CrossRef]
  8. Z.- Yu, J.- Zhao, F. Xia, Z.- Lin, D.- Zhang, J. Leng, and W. Xue, “Enhanced electrical stability of flexible indium tin oxide films prepared on stripe SiO2 buffer layer-coated polymer substrates by magnetron sputtering,” Appl. Surf. Sci.257(11), 4807–4810 (2011). [CrossRef]
  9. K. A. Sierros, D. S. Hecht, D. A. Banerjee, N. J. Morris, L. Hu, G. C. Irvin, R. S. Lee, and D. R. Cairns, “Durable transparent carbon nanotube films for flexible device components,” Thin Solid Films518(23), 6977–6983 (2010). [CrossRef]
  10. J. R. Lee, D. Y. Lee, D. G. Kim, G. H. Lee, Y. D. Kim, and P. K. Song, “Characteristics of ITO films deposited on a PET substrate under various deposition conditions,” Met. Mater. Int.14(6), 745–751 (2008). [CrossRef]
  11. M. M. Hamasha, K. Alzoubi, S. Lu, and S. B. Desu, “Durability study on sputtered indium tin oxide thin film on poly ethylene terephthalate substrate,” Thin Solid Films519(18), 6033–6038 (2011). [CrossRef]
  12. J.-W. Park, G. Kim, S.-H. Lee, E.-H. Kim, and G.-H. Lee, “The effect of film microstructures on cracking of transparent conductive oxide (TCO) coatings on polymer substrates,” Surf. Coat. Technol.205(3), 915–921 (2010). [CrossRef]
  13. O. Ourida and B. M. Said, “Influence of the blend concentration of P3HT: PCBM in the performances of BHJ solar cells,” SATRESET1, 90–92 (2011).
  14. J. P. Rakotoniana, O. Breitenstein, and M. Langenkamp, “Localization of weak heat sources in electronic devices using highly sensitive lock-in thermography,” Mater. Sci. Eng. B Adv. Funct. Solid State Mater. B91–92, 481–485 (2002).
  15. A. Wolf, P. Pohl, and R. Brendel, “Thermophysical analysis of thin films by lock-in thermography,” J. Appl. Phys.96(11), 6306–6312 (2004). [CrossRef]
  16. O. Kunz, J. Wong, J. Janssens, J. Bauer, O. Breitenstein, and A. G. Aberle, “Shunting problems due to sub-micron pinholes in evaporated solid-phase crystallised poly-Si thin-film solar cells on glass,” Prog. Photovolt. Res. Appl.17(1), 35–46 (2009). [CrossRef]
  17. H. Straube, J.-M. Wagner, J. Schneider, and O. Breitenstein, “Quantitative evaluation of loss mechanisms in thin film solar cells using lock-in thermography,” J. Appl. Phys.110(8), 084513 (2011). [CrossRef]
  18. K. Leppänen, B. Augustine, J. Saarela, R. Myllylä, and T. Fabritius, “Breaking mechanism of indium tin oxide and its effect on organic photovoltaic cells,” Sol. Energy Mater. Sol. Cells117, 512–518 (2013). [CrossRef]

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