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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 21, Iss. 3 — Feb. 11, 2013
  • pp: 3400–3416

Analytical analysis of a multilayer structure with ultrathin Fe film for magneto-optical sensing

Š. Višňovský, E. Lišková-Jakubisová, I. Harward, and Z. Celinski  »View Author Affiliations

Optics Express, Vol. 21, Issue 3, pp. 3400-3416 (2013)

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Magneto-optic (MO) response in nanostructures with ultrathin Fe considered for the MO mapping of current pulses with a two-dimensional diffraction limited resolution is investigated in detail. The structures consist of an ultrathin Fe layer sandwiched with dielectric layers, deposited on a reflector and covered by a noble metal protecting layer. The structures are modeled as five-layer systems with abrupt interfaces. Analytical expressions are provided that are useful in the search for the maximum of MO reflected wave amplitude polarized perpendicular to the incident linearly polarized wave, |ryx(05)|. The procedure of finding the maximal |ryx(05)| is illustrated on the structures with ultrathin Fe at the laser wavelength of 632.8 nm. The maximal |ryx(05)| of 0.018347 was achieved in the structure AlN(52 nm)/Fe(15 nm)/AlN(26 nm)/Au. The deposition of a 5 nm protecting Au layer reduced |ryx(05)| by 6 per cent.

© 2013 OSA

OCIS Codes
(160.3820) Materials : Magneto-optical materials
(230.3810) Optical devices : Magneto-optic systems
(310.6845) Thin films : Thin film devices and applications

ToC Category:
Thin Films

Original Manuscript: November 20, 2012
Revised Manuscript: January 21, 2013
Manuscript Accepted: January 23, 2013
Published: February 4, 2013

Š. Višňovský, E. Lišková-Jakubisová, I. Harward, and Z. Celinski, "Analytical analysis of a multilayer structure with ultrathin Fe film for magneto-optical sensing," Opt. Express 21, 3400-3416 (2013)

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