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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 21, Iss. 3 — Feb. 11, 2013
  • pp: 3800–3808

Measuring the refractive index around intersubband transition resonance in GaN/AlN multi quantum wells

Elad Gross, Amir Nevet, Asaf Pesach, Eva Monroy, Shmuel E. Schacham, Meir Orenstein, Mordechai Segev, and Gad Bahir  »View Author Affiliations


Optics Express, Vol. 21, Issue 3, pp. 3800-3808 (2013)
http://dx.doi.org/10.1364/OE.21.003800


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Abstract

We present the direct measurement of the refractive index distribution (spectral dispersion) arising from an intersubband transition in GaN/AlN multi quantum wells structure. The measurement is carried out through a novel interferometric technique. The measured interferogram yields a change in the refractive index varying from −5 × 10−3 to 6 × 10−3 as a function of the wavelength, introduced by the intersubband resonance at 1.5 µm. These results compare well with those derived using Kramers-Kronig transform of the measured absorption spectrum.

© 2013 OSA

OCIS Codes
(120.5060) Instrumentation, measurement, and metrology : Phase modulation
(160.4760) Materials : Optical properties
(160.6000) Materials : Semiconductor materials
(260.3160) Physical optics : Interference
(230.4205) Optical devices : Multiple quantum well (MQW) modulators

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: November 5, 2012
Revised Manuscript: December 25, 2012
Manuscript Accepted: January 9, 2013
Published: February 7, 2013

Citation
Elad Gross, Amir Nevet, Asaf Pesach, Eva Monroy, Shmuel E. Schacham, Meir Orenstein, Mordechai Segev, and Gad Bahir, "Measuring the refractive index around intersubband transition resonance in GaN/AlN multi quantum wells," Opt. Express 21, 3800-3808 (2013)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-21-3-3800


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