Diminishing relative jitter in electrooptic sampling of active mm-wave and THz circuits

doi:10.1364/OE.21.004396

Diminishing relative jitter in electrooptic sampling of active mm-wave and THz circuits

M. Jamshidifar and P. Haring Bolívar »View Author Affiliations

Optics Express, Vol. 21, Issue 4, pp. 4396-4404 (2013)
http://dx.doi.org/10.1364/OE.21.004396

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Abstract
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References (9)
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Abstract

In this work a novel approach in synchronization of electrooptic sampling systems for the ultra-broadband characterization of active mm-wave and THz devices is presented. The relative time jitter between sampled circuit and probing electrooptic head is eliminated by using a femtosecond laser system both as the generator of CW driving the device under test as well as the impulsively probing element. Previous ultra-broadband approaches were applicable to passive components driven by THz impulses, only. The presented system is more generally applicable to active mm-wave and THz components driven by conventional CW electronic sources. Broadband analysis on silicon nonlinear transmission line elements up to a frequency of 300 GHz is presented in order to illustrate the capabilities of the concept.

OCIS Codes
(230.2090) Optical devices : Electro-optical devices
(320.7080) Ultrafast optics : Ultrafast devices

ToC Category:
Ultrafast Optics

History
Original Manuscript: October 24, 2012
Revised Manuscript: January 11, 2013
Manuscript Accepted: January 11, 2013
Published: February 13, 2013

Citation
M. Jamshidifar and P. Haring Bolívar, "Diminishing relative jitter in electrooptic sampling of active mm-wave and THz circuits," Opt. Express 21, 4396-4404 (2013)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-21-4-4396

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References

J. A. Valdmanis, G. A. Mourou, and C. W. Gabel, “Picosecond electro-optic sampling system,” Appl. Phys. Lett.41(3), 211–212 (1982).
H. -M. Heiliger, M. Nagel, H. G. Roskos, and H. Kurz,” Thin-film microstrip lines for mm and sub-mm-wave on-chip interconnects,” IEEE MTT-S Int. Microwave Symp. Dig.421–424 (1997).
C. Kübler, R. Huber, S. Tübel, and A. Leitenstorfer, “Ultrabroadband detecetion of multi-terahertz field transients with GaSe electro-optic sensors: approaching the near infrared,” Appl. Phys. Lett.85, 3360–3362 (2004).
K. S. Giboney, S. T. Allen, M. J. W. Rodwell, and J. E. Bowers, “Picoseconds measurements by free-running electro-optic sampling,” IEEE Photon. Technol. Lett.6(11), 1353–1355 (1994). [CrossRef]
T. Pfeifer, H. M. Heiliger, T. Löffler, C. Ohlhoff, C. Meyer, G. Lüpke, H. G. Roskos, and H. Kurz, “Optoelectronic on-chip characterization of ultrafast electric devices: measurements techniques and applications,” IEEE J. Sel. Top. Quantum Electron.2(3), 586–604 (1996). [CrossRef]
K. Yang, L. P. B. Katehi, and J. F. Whitaker, “Electric field mapping system using an opticl-fiber-based electrooptic probe,” IEEE Microw. Wirel. Compon. Lett.11(4), 164–166 (2001). [CrossRef]
M. Jamshidifar, G. Spickermann, H. Schäfer, and P. H. Bolivar, “200-Ghz bandwidth on wafer characterization of CMOS nonlinear transmission line using electro-optic sampling,” Microw. Opt. Technol. Lett.54(8), 1858–1862 (2012).
L. Tripodi, M. Matters, D. Van Goor, X. Hu, and A. Rydberg, “Extremely Wideband CMOS Circuits for Future THz Applications,” Analog Circuit Design (Springer, 2012), pp. 237–255.
www.ultra-project.eu

Allen, S. T.
Bolivar, P. H.
Bowers, J. E.
Gabel, C. W.
Giboney, K. S.
Heiliger, H. M.
Heiliger, H. -M.
Huber, R.
Jamshidifar, M.
Katehi, L. P. B.
Kübler, C.
Kurz, H.
Leitenstorfer, A.
Löffler, T.
Lüpke, G.
Meyer, C.
Mourou, G. A.
Nagel, M.
Ohlhoff, C.
Pfeifer, T.
Rodwell, M. J. W.
Roskos, H. G.
Schäfer, H.
Spickermann, G.
Tübel, S.
Valdmanis, J. A.
Whitaker, J. F.
Yang, K.

Appl. Phys. Lett.

J. A. Valdmanis, G. A. Mourou, and C. W. Gabel, “Picosecond electro-optic sampling system,” Appl. Phys. Lett.41(3), 211–212 (1982).
C. Kübler, R. Huber, S. Tübel, and A. Leitenstorfer, “Ultrabroadband detecetion of multi-terahertz field transients with GaSe electro-optic sensors: approaching the near infrared,” Appl. Phys. Lett.85, 3360–3362 (2004).

IEEE J. Sel. Top. Quantum Electron.

T. Pfeifer, H. M. Heiliger, T. Löffler, C. Ohlhoff, C. Meyer, G. Lüpke, H. G. Roskos, and H. Kurz, “Optoelectronic on-chip characterization of ultrafast electric devices: measurements techniques and applications,” IEEE J. Sel. Top. Quantum Electron.2(3), 586–604 (1996). [CrossRef]

IEEE Microw. Wirel. Compon. Lett.

K. Yang, L. P. B. Katehi, and J. F. Whitaker, “Electric field mapping system using an opticl-fiber-based electrooptic probe,” IEEE Microw. Wirel. Compon. Lett.11(4), 164–166 (2001). [CrossRef]

IEEE Photon. Technol. Lett.

K. S. Giboney, S. T. Allen, M. J. W. Rodwell, and J. E. Bowers, “Picoseconds measurements by free-running electro-optic sampling,” IEEE Photon. Technol. Lett.6(11), 1353–1355 (1994). [CrossRef]

Microw. Opt. Technol. Lett.

M. Jamshidifar, G. Spickermann, H. Schäfer, and P. H. Bolivar, “200-Ghz bandwidth on wafer characterization of CMOS nonlinear transmission line using electro-optic sampling,” Microw. Opt. Technol. Lett.54(8), 1858–1862 (2012).

Other

L. Tripodi, M. Matters, D. Van Goor, X. Hu, and A. Rydberg, “Extremely Wideband CMOS Circuits for Future THz Applications,” Analog Circuit Design (Springer, 2012), pp. 237–255.
www.ultra-project.eu
H. -M. Heiliger, M. Nagel, H. G. Roskos, and H. Kurz,” Thin-film microstrip lines for mm and sub-mm-wave on-chip interconnects,” IEEE MTT-S Int. Microwave Symp. Dig.421–424 (1997).

2012, Jamshidifar, Microw. Opt. Technol. Lett.
2004, Kübler, Appl. Phys. Lett.
2001, Yang, IEEE Microw. Wirel. Compon. Lett.
1996, Pfeifer, IEEE J. Sel. Top. Quantum Electron.
1994, Giboney, IEEE Photon. Technol. Lett.
1982, Valdmanis, Appl. Phys. Lett.

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