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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 21, Iss. 4 — Feb. 25, 2013
  • pp: 4396–4404

Diminishing relative jitter in electrooptic sampling of active mm-wave and THz circuits

M. Jamshidifar and P. Haring Bolívar  »View Author Affiliations


Optics Express, Vol. 21, Issue 4, pp. 4396-4404 (2013)
http://dx.doi.org/10.1364/OE.21.004396


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Abstract

In this work a novel approach in synchronization of electrooptic sampling systems for the ultra-broadband characterization of active mm-wave and THz devices is presented. The relative time jitter between sampled circuit and probing electrooptic head is eliminated by using a femtosecond laser system both as the generator of CW driving the device under test as well as the impulsively probing element. Previous ultra-broadband approaches were applicable to passive components driven by THz impulses, only. The presented system is more generally applicable to active mm-wave and THz components driven by conventional CW electronic sources. Broadband analysis on silicon nonlinear transmission line elements up to a frequency of 300 GHz is presented in order to illustrate the capabilities of the concept.

© 2013 OSA

OCIS Codes
(230.2090) Optical devices : Electro-optical devices
(320.7080) Ultrafast optics : Ultrafast devices

ToC Category:
Ultrafast Optics

History
Original Manuscript: October 24, 2012
Revised Manuscript: January 11, 2013
Manuscript Accepted: January 11, 2013
Published: February 13, 2013

Citation
M. Jamshidifar and P. Haring Bolívar, "Diminishing relative jitter in electrooptic sampling of active mm-wave and THz circuits," Opt. Express 21, 4396-4404 (2013)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-21-4-4396


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References

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