© 2013 OSA

1. D. A. B. Miller, “Optical interconnects to electronic chips,” Appl. Opt.49(25), F59–F70 (2010). [CrossRef] [PubMed]
2. S. J. B. Yoo, “Future prospects of silicon photonics in next generation communication and computing systems,” Electron. Lett.45(12), 584–588 (2009). [CrossRef]
3. D. B. Keck and R. Tynes, “Spectral response of low-loss optical waveguides,” Appl. Opt.11(7), 1502–1506 (1972). [CrossRef] [PubMed]
4. S. Taebi, M. Khorasaninejad, and S. S. Saini, “Modified Fabry-Perot interferometric method for waveguide loss measurement,” Appl. Opt.47(35), 6625–6630 (2008). [CrossRef] [PubMed]
5. P. Dumon, W. Bogaerts, V. Wiaux, J. Wouters, S. Beckx, J. Van Campenhout, D. Taillaert, B. Luyssaert, P. Bienstman, D. Van Thourhout, and R. Baets, “Low-Loss SOI Photonic wires and ring resonators fabricated With deep UV lithography,” IEEE Photon. Technol. Lett.16(5), 1328–1330 (2004). [CrossRef]
6. J. Hu, V. Tarasov, A. Agarwal, L. Kimerling, N. Carlie, L. Petit, and K. Richardson, “Fabrication and testing of planar chalcogenide waveguide integrated microfluidic sensor,” Opt. Express15(5), 2307–2314 (2007). [CrossRef] [PubMed]
7. T. R. Bourk, M. M. Z. Kharadly, and J. E. Lewis, “Measurement of waveguide attenuation by resonance methods,” Electron. Lett.4(13), 267–268 (1968). [CrossRef]
8. K. K. Lee, D. R. Lim, L. Hsin-Chiao, A. J. Agarwal,, L. C. Foresi, and Kimerling.,” Effect of size and roughness on light transmission in a Si/SiO2 waveguide: Experiments and model,” Appl. Phys. Lett.77, 1617–1619 (2000). [CrossRef]
9. M. Williamson and A. Neureuther, “Enhanced, quantitative analysis of resist image contrast upon line edge roughness (LER),” Proc. SPIE5039, 423–432 (2003). [CrossRef]
10. T. Barwicz and H. A. Haus, “Three-dimensional analysis os scattering losses due to sidewall roughness in microphotonic waveguides,” J. Lightwave Technol.23(9), 2719–2732 (2005). [CrossRef]
11. K. K. Lee, D. R. Lim, L. C. Kimerling, J. Shin, and F. Cerrina, “Fabrication of ultralow-loss Si/SiO2 waveguides by roughness reduction,” Opt. Lett.26(23), 1888–1890 (2001). [CrossRef]
12. B. E. Little, J. P. Laine, and S. T. Chu, “Surface-roughness-induced contradirectional coupling in ring and disk resonators,” Opt. Lett.22(1), 4–6 (1997). [CrossRef] [PubMed]
13. R. E. Collin, Foundation for Microwave Engineering, 2nd ed. (McGraw-Hill, N.Y., 2000).
14. A. Yariv, “Universal relations for coupling of optical power between microresonators and dielectric waveguides,” Electron. Lett.36(4), 321–322 (2000). [CrossRef]
15. Z. Zhang, M. Dainese, L. Wosinski, and M. Qiu, “Resonance-splitting and enhanced notch depth in SOI ring resonators with mutual mode coupling,” Opt. Express16(7), 4621–4630 (2008). [CrossRef] [PubMed]

Appl. Opt.

• D. B. Keck and R. Tynes, “Spectral response of low-loss optical waveguides,” Appl. Opt.11(7), 1502–1506 (1972). [CrossRef] [PubMed]
• S. Taebi, M. Khorasaninejad, and S. S. Saini, “Modified Fabry-Perot interferometric method for waveguide loss measurement,” Appl. Opt.47(35), 6625–6630 (2008). [CrossRef] [PubMed]
• D. A. B. Miller, “Optical interconnects to electronic chips,” Appl. Opt.49(25), F59–F70 (2010). [CrossRef] [PubMed]

Appl. Phys. Lett.

• K. K. Lee, D. R. Lim, L. Hsin-Chiao, A. J. Agarwal,, L. C. Foresi, and Kimerling.,” Effect of size and roughness on light transmission in a Si/SiO2 waveguide: Experiments and model,” Appl. Phys. Lett.77, 1617–1619 (2000). [CrossRef]

Electron. Lett.

• S. J. B. Yoo, “Future prospects of silicon photonics in next generation communication and computing systems,” Electron. Lett.45(12), 584–588 (2009). [CrossRef]
• A. Yariv, “Universal relations for coupling of optical power between microresonators and dielectric waveguides,” Electron. Lett.36(4), 321–322 (2000). [CrossRef]
• T. R. Bourk, M. M. Z. Kharadly, and J. E. Lewis, “Measurement of waveguide attenuation by resonance methods,” Electron. Lett.4(13), 267–268 (1968). [CrossRef]

IEEE Photon. Technol. Lett.

• P. Dumon, W. Bogaerts, V. Wiaux, J. Wouters, S. Beckx, J. Van Campenhout, D. Taillaert, B. Luyssaert, P. Bienstman, D. Van Thourhout, and R. Baets, “Low-Loss SOI Photonic wires and ring resonators fabricated With deep UV lithography,” IEEE Photon. Technol. Lett.16(5), 1328–1330 (2004). [CrossRef]

J. Lightwave Technol.

• T. Barwicz and H. A. Haus, “Three-dimensional analysis os scattering losses due to sidewall roughness in microphotonic waveguides,” J. Lightwave Technol.23(9), 2719–2732 (2005). [CrossRef]

Opt. Express

• Z. Zhang, M. Dainese, L. Wosinski, and M. Qiu, “Resonance-splitting and enhanced notch depth in SOI ring resonators with mutual mode coupling,” Opt. Express16(7), 4621–4630 (2008). [CrossRef] [PubMed]
• J. Hu, V. Tarasov, A. Agarwal, L. Kimerling, N. Carlie, L. Petit, and K. Richardson, “Fabrication and testing of planar chalcogenide waveguide integrated microfluidic sensor,” Opt. Express15(5), 2307–2314 (2007). [CrossRef] [PubMed]

Opt. Lett.

• K. K. Lee, D. R. Lim, L. C. Kimerling, J. Shin, and F. Cerrina, “Fabrication of ultralow-loss Si/SiO2 waveguides by roughness reduction,” Opt. Lett.26(23), 1888–1890 (2001). [CrossRef]
• B. E. Little, J. P. Laine, and S. T. Chu, “Surface-roughness-induced contradirectional coupling in ring and disk resonators,” Opt. Lett.22(1), 4–6 (1997). [CrossRef] [PubMed]

Proc. SPIE

• M. Williamson and A. Neureuther, “Enhanced, quantitative analysis of resist image contrast upon line edge roughness (LER),” Proc. SPIE5039, 423–432 (2003). [CrossRef]

Other

• R. E. Collin, Foundation for Microwave Engineering, 2nd ed. (McGraw-Hill, N.Y., 2000).

Click here to see a list of articles that cite this paper

Related Journal Articles

• Effect of wall tilt on the optical properties of integrated directional couplers (OL)
• Initial three-dimensional finite-difference time-domain phenomenology study of the transient response of a large vertically coupled photonic racetrack (OL)
• Matrix analysis of microring coupled-resonator optical waveguides (OE)
• Analysis of coupling between two slab waveguides in the presence of ring resonators (JOSAA)
• Transmission and radiation in a slab waveguide coupled to a whispering-gallery resonator: volume-integral-equation analysis (JOSAA)

Related Conference Papers

• Tunable Slow-Wave Optical Delay-Lines
• Low Group Velocity Devices in Silicon Photonics
• Tunable Optical Delay on Silicon Chip with a Double-Ring Resonator
• Symmetry Induced "Heavy" and "Light" Photons in Modified Parallel-Coupled Microrings Waveguides
• A New Time Domain Full-Band Method Using Orthogonal Edge Basis Functions for Photonics Applications