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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 21, Iss. 5 — Mar. 11, 2013
  • pp: 6519–6525

Resonance enhancement of terahertz metamaterials by liquid crystals/indium tin oxide interfaces

Zhen Liu, Chia-Yi Huang, Hongwei Liu, Xinhai Zhang, and Chengkuo Lee  »View Author Affiliations


Optics Express, Vol. 21, Issue 5, pp. 6519-6525 (2013)
http://dx.doi.org/10.1364/OE.21.006519


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Abstract

This work fabricates a terahertz (THz) metamaterial device, whose structure consists of split ring resonator array/ plastic substrate/ Indium Tin Oxide (ITO) film/ liquid crystals/ ITO film/ plastic substrate. Experiment results show that the resonance of the THz metamaterial device can be enhanced as voltage is applied to the liquid crystals. The enhancement will be more significant as higher voltage applied. The resonance enhancement is attributed to the fact that the liquid crystals/ITO interfaces exhibit the large difference in terms of refractive index between the two materials in THz regime. The interfaces reflect the incident electromagnetic wave and cause the reflected wave to enhance the resonance of the metamaterials. As those frequency-tunable metamaterial devices show different resonant transmittance at different frequencies, which is undesired, the liquid crystals/ITO interfaces can improve those frequency-tunable metamaterial devices with a constant transmittance at different frequencies.

© 2013 OSA

OCIS Codes
(160.3710) Materials : Liquid crystals
(160.3918) Materials : Metamaterials
(300.6495) Spectroscopy : Spectroscopy, teraherz
(230.7408) Optical devices : Wavelength filtering devices

ToC Category:
Metamaterials

History
Original Manuscript: November 6, 2012
Revised Manuscript: January 30, 2013
Manuscript Accepted: February 20, 2013
Published: March 8, 2013

Citation
Zhen Liu, Chia-Yi Huang, Hongwei Liu, Xinhai Zhang, and Chengkuo Lee, "Resonance enhancement of terahertz metamaterials by liquid crystals/indium tin oxide interfaces," Opt. Express 21, 6519-6525 (2013)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-21-5-6519


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