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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 21, Iss. 6 — Mar. 25, 2013
  • pp: 6658–6669

Measurements of the group delay and the group delay dispersion with resonance scanning interferometer

M. K. Trubetskov, M. von Pechmann, I. B. Angelov, K. L. Vodopyanov, F. Krausz, and V. Pervak  »View Author Affiliations


Optics Express, Vol. 21, Issue 6, pp. 6658-6669 (2013)
http://dx.doi.org/10.1364/OE.21.006658


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Abstract

We developed a method for group delay and group delay dispersion measurements, based on location of interference resonance peaks. Such resonance peaks can be observed in transmittance or in reflectance when two mirrors are placed parallel to each other and separated by a thin air spacer. By using a novel approach, based on simultaneous processing of the data acquired for different spacer distances we obtained reliable results with high resolution. Measurements were performed both in transmittance and reflectance layouts depending on the reflectivity of the mirror to be measured. The developed method allows dispersion measurements of ultraviolet mirrors and ultra-broadband mirrors spanning more than one optical octave to be performed.

© 2013 OSA

OCIS Codes
(310.1620) Thin films : Interference coatings
(320.5520) Ultrafast optics : Pulse compression
(320.7100) Ultrafast optics : Ultrafast measurements

ToC Category:
Ultrafast Optics

History
Original Manuscript: January 23, 2013
Revised Manuscript: March 1, 2013
Manuscript Accepted: March 1, 2013
Published: March 11, 2013

Citation
M. K. Trubetskov, M. von Pechmann, I. B. Angelov, K. L. Vodopyanov, F. Krausz, and V. Pervak, "Measurements of the group delay and the group delay dispersion with resonance scanning interferometer," Opt. Express 21, 6658-6669 (2013)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-21-6-6658


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