OSA's Digital Library

Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 21, Iss. 6 — Mar. 25, 2013
  • pp: 6837–6844

Highly directional thermal emission from two-dimensional silicon structures

Troy Ribaudo, David W. Peters, A. Robert Ellis, Paul S. Davids, and Eric A. Shaner  »View Author Affiliations

Optics Express, Vol. 21, Issue 6, pp. 6837-6844 (2013)

View Full Text Article

Enhanced HTML    Acrobat PDF (1323 KB)

Browse Journals / Lookup Meetings

Browse by Journal and Year


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools



We simulate, fabricate, and characterize near perfectly absorbing two-dimensional grating structures in the thermal infrared using heavily doped silicon (HdSi) that supports long wave infrared surface plasmon polaritons (LWIR SPP’s). The devices were designed and optimized using both finite difference time domain (FDTD) and rigorous coupled wave analysis (RCWA) simulation techniques to satisfy stringent requirements for thermal management applications requiring high thermal radiation absorption over a narrow angular range and low visible radiation absorption over a broad angular range. After optimization and fabrication, characterization was performed using reflection spectroscopy and normal incidence emissivity measurements. Excellent agreement between simulation and experiment was obtained.

© 2013 OSA

OCIS Codes
(240.6680) Optics at surfaces : Surface plasmons
(260.3060) Physical optics : Infrared
(300.2140) Spectroscopy : Emission
(350.2770) Other areas of optics : Gratings

ToC Category:
Optics at Surfaces

Original Manuscript: January 14, 2013
Revised Manuscript: February 19, 2013
Manuscript Accepted: February 20, 2013
Published: March 12, 2013

Troy Ribaudo, David W. Peters, A. Robert Ellis, Paul S. Davids, and Eric A. Shaner, "Highly directional thermal emission from two-dimensional silicon structures," Opt. Express 21, 6837-6844 (2013)

Sort:  Author  |  Year  |  Journal  |  Reset  


  1. C. Sirtori, C. Gmachl, F. Capasso, J. Faist, D. L. Sivco, A. L. Hutchinson, and A. Y. Cho, “Long-wavelength (λ≈ 8-11.5 μm) semiconductor lasers with waveguides based on surface plasmons,” Opt. Lett.23, 1366 (1998). [CrossRef] [PubMed]
  2. N. Yu, J. Fan, Q. J. Wang, C. Pflügl, L. Diehl, T. Edamura, M. Yamanishi, H. Kan, and F. Capasso, “Small-divergence semiconductor lasers by plasmonic collimation,” Nat. Photonics2(9), 564–570 (2008). [CrossRef]
  3. J. C. Ginn, R. L. Jarecki, E. A. Shaner, and P. S. Davids, “Infrared plasmons on heavily-doped silicon,” J. Appl. Phys.110(4), 043110 (2011). [CrossRef]
  4. P. J. Hesketh, J. N. Zemel, and B. Gebhart, “Polarized spectral emittance from periodic micromachined surfaces. I. Doped silicon: The normal direction,” Phys. Rev. B Condens. Matter37(18), 10795–10802 (1988). [CrossRef] [PubMed]
  5. P. J. Hesketh, J. N. Zemel, and B. Gebhart, “Polarized spectral emittance from periodic micromachined surfaces. II. Doped silicon: Angular variation,” Phys. Rev. B Condens. Matter37(18), 10803–10813 (1988). [CrossRef] [PubMed]
  6. M. Auslender and S. Hava, “Zero Infrared reflectance anomaly in doped silicon lamellar gratings. I. From antireflection to total absorption,” Infrared Phys. Technol.36(7), 1077–1088 (1995). [CrossRef]
  7. J. W. Cleary, R. E. Peale, D. J. Shelton, G. D. Boreman, C. W. Smith, M. Ishigami, R. Soref, A. Drehman, and W. R. Buchwald, “IR permittivities for silicides and doped silicon,” J. Opt. Soc. Am. B27(4), 730 (2010). [CrossRef]
  8. M. Shahzad, G. Medhi, R. E. Peale, R. Tsuchikawa, M. Ishigami, W. Buchwald, J. Cleary, G. D. Boreman, O. Edwards, D. J. Diaz, and T. A. Gorman, “Infrared surface waves on semiconductor and conducting polymer,” Proc. SPIE8024, 80240B (2011).
  9. G. Kirchho, Monatsberichte der Akademie der Wissenschaften zu Berlin, sessions of Dec. 1859–1860, 783–787.
  10. E. D. Palik, Handbook of Optical Constants of Solids (Elsevier, 1998).
  11. A. R. Ellis, H. M. Graham, M. B. Sinclair, and J. C. Verley, “Variable-angle directional emissometer for moderate-temperature emissivity measurements,” Proc. SPIE7065, 706508, 706508-9 (2008). [CrossRef]

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited