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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 21, Iss. 6 — Mar. 25, 2013
  • pp: 6880–6888

Observation of electromagnetically induced transparency in evanescent fields

R. Thomas, C. Kupchak, G. S. Agarwal, and A. I. Lvovsky  »View Author Affiliations


Optics Express, Vol. 21, Issue 6, pp. 6880-6888 (2013)
http://dx.doi.org/10.1364/OE.21.006880


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Abstract

We observe and investigate, both experimentally and theoretically, electromagnetically-induced transparency experienced by evanescent fields arising due to total internal reflection from an interface of glass and hot rubidium vapor. This phenomenon manifests itself as a non-Lorentzian peak in the reflectivity spectrum, which features a sharp cusp with a sub-natural width of about 1 MHz. The width of the peak is independent of the thickness of the interaction region, which indicates that the main source of decoherence is likely due to collisions with the cell walls rather than diffusion of atoms. With the inclusion of a coherence-preserving wall coating, this system could be used as an ultra-compact frequency reference.

© 2013 OSA

OCIS Codes
(020.1670) Atomic and molecular physics : Coherent optical effects
(300.6210) Spectroscopy : Spectroscopy, atomic

ToC Category:
Atomic and Molecular Physics

History
Original Manuscript: December 14, 2012
Revised Manuscript: February 28, 2013
Manuscript Accepted: February 28, 2013
Published: March 12, 2013

Citation
R. Thomas, C. Kupchak, G. S. Agarwal, and A. I. Lvovsky, "Observation of electromagnetically induced transparency in evanescent fields," Opt. Express 21, 6880-6888 (2013)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-21-6-6880


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