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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 21, Iss. 7 — Apr. 8, 2013
  • pp: 8564–8569

An optical test for identifying topological insulator thin films

Jun-ichi Inoue  »View Author Affiliations


Optics Express, Vol. 21, Issue 7, pp. 8564-8569 (2013)
http://dx.doi.org/10.1364/OE.21.008564


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Abstract

As the search for new compounds of a topological insulator (TI) becomes more extensive, it is increasingly important to develop an experimental technique that can identify TIs. In this work, we theoretically propose a simple optical method for distinguishing between topological and conventional insulator thin films. An electromagnetic interference wave consisting of waves transmitted through and reflected by the TI thin film is sensitive to the circular polarization direction of the incident electromagnetic wave. Based on this fact, we can identify a TI by observing the interference wave. This method is straightforward, and thus should propel TI research.

© 2013 OSA

OCIS Codes
(310.3840) Thin films : Materials and process characterization
(310.6860) Thin films : Thin films, optical properties
(310.6805) Thin films : Theory and design

ToC Category:
Thin Films

History
Original Manuscript: December 27, 2012
Revised Manuscript: March 12, 2013
Manuscript Accepted: March 14, 2013
Published: April 1, 2013

Citation
Jun-ichi Inoue, "An optical test for identifying topological insulator thin films," Opt. Express 21, 8564-8569 (2013)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-21-7-8564


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