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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 21, Iss. 7 — Apr. 8, 2013
  • pp: 9113–9122

Strong absorption and selective emission from engineered metals with dielectric coatings

W. Streyer, S. Law, G. Rooney, T. Jacobs, and D. Wasserman  »View Author Affiliations

Optics Express, Vol. 21, Issue 7, pp. 9113-9122 (2013)

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We demonstrate strong-to-perfect absorption across a wide range of mid-infrared wavelengths (5-12µm) using a two-layer system consisting of heavily-doped silicon and a thin high-index germanium dielectric layer. We demonstrate spectral control of the absorption resonance by varying the thickness of the dielectric layer. The absorption resonance is shown to be largely polarization-independent and angle-invariant. Upon heating, we observe selective thermal emission from our materials. Experimental data is compared to an analytical model of our structures with strong agreement.

© 2013 OSA

OCIS Codes
(310.6860) Thin films : Thin films, optical properties
(290.6815) Scattering : Thermal emission

ToC Category:
Thin Films

Original Manuscript: February 19, 2013
Revised Manuscript: March 18, 2013
Manuscript Accepted: March 28, 2013
Published: April 4, 2013

W. Streyer, S. Law, G. Rooney, T. Jacobs, and D. Wasserman, "Strong absorption and selective emission from engineered metals with dielectric coatings," Opt. Express 21, 9113-9122 (2013)

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