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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 21, Iss. 8 — Apr. 22, 2013
  • pp: 10278–10288

Enhanced 1.54 μm emission in Y-Er disilicate thin films on silicon photonic crystal cavities

R. Lo Savio, M. Miritello, A. Shakoor, P. Cardile, K. Welna, L. C. Andreani, D. Gerace, T. F. Krauss, L. O’Faolain, F. Priolo, and M. Galli  »View Author Affiliations

Optics Express, Vol. 21, Issue 8, pp. 10278-10288 (2013)

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We introduce an Y-Er disilicate thin film deposited on top of a silicon photonic crystal cavity as a gain medium for active silicon photonic devices. Using photoluminescence analysis, we demonstrate that Er luminescence at 1.54 μm is enhanced by coupling with the cavity modes, and that the directionality of the Er optical emission can be controlled through far-field optimization of the cavity. We determine the maximum excitation power that can be coupled into the cavity to be 12 mW, which is limited by free carrier absorption and thermal heating. At maximum excitation, we observe that nearly 30% of the Er population is in the excited state, as estimated from the direct measurement of the emitted power. Finally, using time-resolved photoluminescence measurements, we determine a value of 2.3 for the Purcell factor of the system at room temperature. These results indicate that overcoating a silicon photonic nanostructure with an Er-rich dielectric layer is a promising method for achieving light emission at 1.54 µm wavelength on a silicon platform.

© 2013 OSA

OCIS Codes
(160.5690) Materials : Rare-earth-doped materials
(230.0230) Optical devices : Optical devices
(260.3800) Physical optics : Luminescence
(230.5298) Optical devices : Photonic crystals

ToC Category:
Photonic Crystals

Original Manuscript: December 11, 2012
Revised Manuscript: March 8, 2013
Manuscript Accepted: March 15, 2013
Published: April 18, 2013

R. Lo Savio, M. Miritello, A. Shakoor, P. Cardile, K. Welna, L. C. Andreani, D. Gerace, T. F. Krauss, L. O’Faolain, F. Priolo, and M. Galli, "Enhanced 1.54 μm emission in Y-Er disilicate thin films on silicon photonic crystal cavities," Opt. Express 21, 10278-10288 (2013)

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