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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 21, Iss. 9 — May. 6, 2013
  • pp: 11523–11535

Quantitative plasmonic measurements using embedded phase stepping confocal interferometry

Bei Zhang, Suejit Pechprasarn, and Michael G. Somekh  »View Author Affiliations

Optics Express, Vol. 21, Issue 9, pp. 11523-11535 (2013)

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In previous publications [Opt. Express 20, 7388 (2012), Opt. Express 20, 28039 (2012)] we showed how a confocal configuration can form an surface plasmon microscope involving interference between a path involving the generation of surface plasmons and one involving a directly reflected beam. The relative phase of these contributions changes with axial scan position allowing the phase velocity of the surface plasmon to be measured. In this paper we extend the interferometer concept to produce an ‘embedded’ phase shifting interferometer, where we can control the phase between the reference and surface plasmon beams with a spatial light modulator. We demonstrate that this approach facilitates extraction of the amplitude and phase of the surface plasmon to measure of the phase velocity and the attenuation of the surface plasmons with greatly improved signal to noise compared to previous measurement approaches. We also show that reliable results are obtained over smaller axial scan ranges giving potentially superior lateral resolution.

© 2013 OSA

OCIS Codes
(060.4080) Fiber optics and optical communications : Modulation
(110.0110) Imaging systems : Imaging systems
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(180.0180) Microscopy : Microscopy

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: February 22, 2013
Revised Manuscript: April 10, 2013
Manuscript Accepted: April 14, 2013
Published: May 3, 2013

Virtual Issues
Vol. 8, Iss. 6 Virtual Journal for Biomedical Optics

Bei Zhang, Suejit Pechprasarn, and Michael G. Somekh, "Quantitative plasmonic measurements using embedded phase stepping confocal interferometry," Opt. Express 21, 11523-11535 (2013)

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