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Energy Express

Energy Express

  • Editor: Christian Seassal
  • Vol. 22, Iss. S2 — Mar. 10, 2014
  • pp: A402–A415

Reflectance properties of silicon moth-eyes in response to variations in angle of incidence, polarisation and azimuth orientation

Asa Asadollahbaik, Stuart A. Boden, Martin D. B. Charlton, David N. R. Payne, Simon Cox, and Darren M. Bagnall  »View Author Affiliations

Optics Express, Vol. 22, Issue S2, pp. A402-A415 (2014)

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We report a study of the optical properties of silicon moth-eye structures using a custom-made fully automated broadband spectroscopic reflectometry system (goniometer). This measurement system is able to measure specular reflectance as a function of wavelength, polar incidence angle and azimuth orientation angle, from normal to near-parallel polar incidence angle. The system uses a linear polarized broadband super-continuum laser light source. It is shown that a moth-eye structure composed of a regular array of protruding silicon rods, with finite sidewall angle reduces reflectance and sensitivity to incident wavelength in comparison to truly cylindrical rods with perpendicular sidewalls. It is also shown that moth-eye structures have omnidirectional reflectance properties in response to azimuth orientation of the sample. The importance of applying the reflectometer setup to study the optical properties of solar cell antireflective structures is highlighted.

© 2014 Optical Society of America

OCIS Codes
(040.5350) Detectors : Photovoltaic
(120.5700) Instrumentation, measurement, and metrology : Reflection
(310.1210) Thin films : Antireflection coatings
(310.6628) Thin films : Subwavelength structures, nanostructures

ToC Category:
Subwavelength structures, nanostructures

Original Manuscript: December 11, 2013
Revised Manuscript: February 6, 2014
Manuscript Accepted: February 9, 2014
Published: February 18, 2014

Asa Asadollahbaik, Stuart A. Boden, Martin D. B. Charlton, David N. R. Payne, Simon Cox, and Darren M. Bagnall, "Reflectance properties of silicon moth-eyes in response to variations in angle of incidence, polarisation and azimuth orientation," Opt. Express 22, A402-A415 (2014)

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