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Design of broadband omnidirectional antireflection coatings using ant colony algorithm

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Abstract

Optimization method which is based on the ant colony algorithm (ACA) is described to optimize antireflection (AR) coating system with broadband omnidirectional characteristics for silicon solar cells incorporated with the solar spectrum (AM1.5 radiation). It’s the first time to use ACA method for optimizing the AR coating system. In this paper, for the wavelength range from 400 nm to 1100 nm, the optimized three-layer AR coating system could provide an average reflectance of 2.98% for incident angles from Raveθ+ to 80° and 6.56% for incident angles from 0° to 90°.

© 2014 Optical Society of America

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Figures (5)

Fig. 1
Fig. 1 Schematic cross section of AR coating system on a silicon substrate for the reflectance calculation by ACA-based method.
Fig. 2
Fig. 2 Illustration of the Ng city-layer system. Each city-layer has A, B, C, D four cities.
Fig. 3
Fig. 3 Flow chart for ACA-based broadband omnidirectional AR coating system optimization method.
Fig. 4
Fig. 4 Simulation results of the reflectance characteristics of theAR coating system designed by (a) GA (b) SA (c) ACA using the same parameters as in [20, 15], (d) ACA (both the thickness and refractive index were optimized) as a function of wavelength from 400nm to 750nm and incident angle from 40 ° to 80 ° .
Fig. 5
Fig. 5 Simulation results of the reflectance performance of optimized AR coating system designed by ACA method as a function of wavelength from 400nm to 1100nm and incident angle from 0 ° to 90 ° .

Tables (4)

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Table 1 Parameters chosen in the optimization using ACA-based method

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Table 2 Thickness (nm) of individual layers of the three-layer AR coating system on silicon designed by different algorithms and the related average reflectivity (incident angle 4 0 ° - 8 0 ° wavelength 400-750 nm)

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Table 3 Structure parameters and average reflectances of the three-layer AR coating system on silicon designed by ACA method (incident angle 4 0 ° - 8 0 ° wavelength 400-750 nm)

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Table 4 Structure parameters and average reflectances of the three-layer AR coating system on silicon designed by ACA method for wavelength from 400 nm to 1100 nm

Equations (12)

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n i =( n max n min ) j=1 s c i j 2 j1 2 s 1 + n min ,
D i = d i 1 d i 2 d i m ,
d i = d max j=1 m d i j 2 m1 2 m 1 .
L= C 1 D 1 C 2 D 2 C N D N .
L= c 1 1 d 1 1 c 1 2 d 1 2 ... c 1 g d 1 g c 2 1 d 2 1 c 2 2 d 2 2 ... c i j d i j ... c N g d N g ,
R ave θ = 1 λ 2 λ 1 2 π λ 1 λ 2 θ 1 θ 2 R TE + R TM 2 dθdλ,
j={ arg max[ τ(d,i,j) ] if q q 0 P otherwise ,
P(d,i,j)= τ(d,i,j) j τ(d,i,j) .
τ(i,j)=(1ρ)τ(i,j)+Δτ(i,j)+eΔ τ e (i,j),
Δτ(i,j)= k=1 K Δ τ k (i,j) .
Δ τ k (i,j)={ Q/ R ave θ if (i,j)tour 0 otherwise ,
Δ τ e (i,j)={ Q/ R ave θ+ if (i,j)the shortest tour 0 otherwise ,
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