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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 22, Iss. 11 — Jun. 2, 2014
  • pp: 13846–13859

Restoration of soft x-ray laser images of nanostructures

Damir Seršić, Ana Sović, and Carmen S. Menoni  »View Author Affiliations


Optics Express, Vol. 22, Issue 11, pp. 13846-13859 (2014)
http://dx.doi.org/10.1364/OE.22.013846


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Abstract

We present advanced techniques for the restoration of images obtained by soft x-ray laser microscopy. We show two methods. One method is based on adaptive thresholding, while the other uses local Wiener filtering in the wavelet domain to achieve high noise gains. These wavelet based denoising techniques are improved using spatial noise modeling. The accurate noise model is built up from two consecutive images of the object and respective background images. To our knowledge, the results of both proposed approaches over-perform competitive methods. The analysis is robust to enable image acquisition with significantly lower exposure times, which is critical in samples that are sensitive to radiation damage as is the case of biological samples imaged by SXR microscopy.

© 2014 Optical Society of America

OCIS Codes
(070.6110) Fourier optics and signal processing : Spatial filtering
(100.2980) Image processing : Image enhancement
(100.3020) Image processing : Image reconstruction-restoration
(100.7410) Image processing : Wavelets
(180.7460) Microscopy : X-ray microscopy
(340.7480) X-ray optics : X-rays, soft x-rays, extreme ultraviolet (EUV)

ToC Category:
Image Processing

History
Original Manuscript: March 24, 2014
Revised Manuscript: May 20, 2014
Manuscript Accepted: May 21, 2014
Published: May 30, 2014

Citation
Damir Seršić, Ana Sović, and Carmen S. Menoni, "Restoration of soft x-ray laser images of nanostructures," Opt. Express 22, 13846-13859 (2014)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-22-11-13846


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