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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 22, Iss. 12 — Jun. 16, 2014
  • pp: 14246–14252

Grating based x-ray differential phase contrast imaging without mechanical phase stepping

Yongshuai Ge, Ke Li, John Garrett, and Guang-Hong Chen  »View Author Affiliations

Optics Express, Vol. 22, Issue 12, pp. 14246-14252 (2014)

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Grating-based x-ray differential phase contrast imaging (DPCI) often uses a phase stepping procedure to acquire data that enables the extraction of phase information. This method prolongs the time needed for data acquisition by several times compared with conventional x-ray absorption image acquisitions. A novel analyzer grating design was developed in this work to eliminate the additional data acquisition time needed to perform phase stepping in DPCI. The new analyzer grating was fabricated such that the linear grating structures are shifted from one detector row to the next; the amount of the lateral shift was equal to a fraction of the x-ray diffraction fringe pattern. The x-ray data from several neighboring detector rows were then combined to extract differential phase information. Initial experimental results have demonstrated that the new analyzer grating enables accurate DPCI signal acquisition from a single x-ray exposure like conventional x-ray absorption imaging.

© 2014 Optical Society of America

OCIS Codes
(050.1950) Diffraction and gratings : Diffraction gratings
(110.6760) Imaging systems : Talbot and self-imaging effects
(340.7440) X-ray optics : X-ray imaging
(340.7450) X-ray optics : X-ray interferometry

ToC Category:
X-ray Optics

Original Manuscript: March 24, 2014
Revised Manuscript: May 22, 2014
Manuscript Accepted: May 22, 2014
Published: June 3, 2014

Yongshuai Ge, Ke Li, John Garrett, and Guang-Hong Chen, "Grating based x-ray differential phase contrast imaging without mechanical phase stepping," Opt. Express 22, 14246-14252 (2014)

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