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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 22, Iss. 12 — Jun. 16, 2014
  • pp: 14859–14870

High-throughput ptychography using Eiger: scanning X-ray nano-imaging of extended regions

Manuel Guizar-Sicairos, Ian Johnson, Ana Diaz, Mirko Holler, Petri Karvinen, Hans-Christian Stadler, Roberto Dinapoli, Oliver Bunk, and Andreas Menzel  »View Author Affiliations

Optics Express, Vol. 22, Issue 12, pp. 14859-14870 (2014)

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The smaller pixel size and high frame rate of next-generation photon counting pixel detectors opens new opportunities for the application of X-ray coherent diffractive imaging (CDI). In this manuscript we demonstrate fast image acquisition for ptychography using an Eiger detector. We achieve above 25,000 resolution elements per second, or an effective dwell time of 40 μs per resolution element, when imaging a 500 μm × 290 μm region of an integrated electronic circuit with 41 nm resolution. We further present the application of a scheme of sharing information between image parts that allows the field of view to exceed the range of the piezoelectric scanning system and requirements on the stability of the illumination to be relaxed.

© 2014 Optical Society of America

OCIS Codes
(040.7480) Detectors : X-rays, soft x-rays, extreme ultraviolet (EUV)
(100.3010) Image processing : Image reconstruction techniques
(100.5070) Image processing : Phase retrieval
(180.7460) Microscopy : X-ray microscopy

ToC Category:
X-ray Optics

Original Manuscript: March 27, 2014
Revised Manuscript: May 10, 2014
Manuscript Accepted: May 11, 2014
Published: June 10, 2014

Virtual Issues
Vol. 9, Iss. 8 Virtual Journal for Biomedical Optics

Manuel Guizar-Sicairos, Ian Johnson, Ana Diaz, Mirko Holler, Petri Karvinen, Hans-Christian Stadler, Roberto Dinapoli, Oliver Bunk, and Andreas Menzel, "High-throughput ptychography using Eiger: scanning X-ray nano-imaging of extended regions," Opt. Express 22, 14859-14870 (2014)

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