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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 22, Iss. 13 — Jun. 30, 2014
  • pp: 15437–15446

Dual scanning and full-field hard x-ray microscopy with a laboratory source

Cristoffer J. Blackhall, Kaye S. Morgan, and Daniele Pelliccia  »View Author Affiliations

Optics Express, Vol. 22, Issue 13, pp. 15437-15446 (2014)

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We report on the experimental demonstration of a hard x-ray microscopy scheme achieving absorption and phase contrast imaging with a standard laboratory source. The x-ray optical system features two crossed planar waveguides coupled to the primary source. The dual waveguide acts as a secondary micron-sized source, enabling high imaging resolution. Both scanning and full-field imaging modes are demonstrated with the same experimental system, with a resolution of about 2 μm in scanning mode. Examples of absorption, differential phase and retrieved phase depth of thin metal grids and glass micro-spheres are reported as proof of concept of the technique.

© 2014 Optical Society of America

OCIS Codes
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(180.5810) Microscopy : Scanning microscopy
(180.7460) Microscopy : X-ray microscopy
(230.7390) Optical devices : Waveguides, planar
(340.7440) X-ray optics : X-ray imaging

ToC Category:
X-ray Optics

Original Manuscript: April 30, 2014
Revised Manuscript: June 6, 2014
Manuscript Accepted: June 9, 2014
Published: June 17, 2014

Virtual Issues
Vol. 9, Iss. 8 Virtual Journal for Biomedical Optics

Cristoffer J. Blackhall, Kaye S. Morgan, and Daniele Pelliccia, "Dual scanning and full-field hard x-ray microscopy with a laboratory source," Opt. Express 22, 15437-15446 (2014)

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