OSA's Digital Library

Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 22, Iss. 15 — Jul. 28, 2014
  • pp: 17872–17879

Sagnac loop mirror and micro-ring based laser cavity for silicon-on-insulator

Yi Zhang, Shuyu Yang, Hang Guan, Andy Eu-Jin Lim, Guo-Qiang Lo, Peter Magill, Tom Baehr-Jones, and Michael Hochberg  »View Author Affiliations


Optics Express, Vol. 22, Issue 15, pp. 17872-17879 (2014)
http://dx.doi.org/10.1364/OE.22.017872


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Abstract

An integrated laser is a key component in silicon based photonic integrated circuits. Beyond incorporating the gain medium, on-chip cavity design is critical to device performance and yield. Typical recent results involve cavities utilizing distributed Bragg gratings that require ultra-fine feature sizes. We propose to build laser cavity on silicon using a Sagnac loop mirror and a micro-ring wavelength filter for the first time. The Sagnac loop mirror provides broadband reflection, which is simple to fabricate, has an accurately-controlled reflectivity, and negligible excess loss. Single-mode operation is achieved with the intra-cavity micro-ring filter and, using a 248 nm stepper, the laser wavelength can be lithographically controlled within a standard deviation of 3.6 nm. We demonstrate a proof-of-concept device lasing at 1551.7 nm, with 44 dB SMSR, 1.2 MHz linewidth and 4.8 mW on-chip output power.

© 2014 Optical Society of America

OCIS Codes
(220.0220) Optical design and fabrication : Optical design and fabrication
(250.5300) Optoelectronics : Photonic integrated circuits
(250.5960) Optoelectronics : Semiconductor lasers

ToC Category:
Integrated Optics

History
Original Manuscript: May 12, 2014
Revised Manuscript: June 27, 2014
Manuscript Accepted: July 9, 2014
Published: July 16, 2014

Citation
Yi Zhang, Shuyu Yang, Hang Guan, Andy Eu-Jin Lim, Guo-Qiang Lo, Peter Magill, Tom Baehr-Jones, and Michael Hochberg, "Sagnac loop mirror and micro-ring based laser cavity for silicon-on-insulator," Opt. Express 22, 17872-17879 (2014)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-22-15-17872


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