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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 22, Iss. 15 — Jul. 28, 2014
  • pp: 18214–18223

Advanced phasemeter for deep phase modulation interferometry

Thomas S. Schwarze, Oliver Gerberding, Felipe Guzmán Cervantes, Gerhard Heinzel, and Karsten Danzmann  »View Author Affiliations


Optics Express, Vol. 22, Issue 15, pp. 18214-18223 (2014)
http://dx.doi.org/10.1364/OE.22.018214


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Abstract

We present the development of an advanced phasemeter for the deep phase modulation interferometry technique. This technique aims for precise length measurements with a high dynamic range using little optical hardware. The advanced phasemeter uses fast ADCs and an FPGA to implement a design of multiple single-bin Fourier transforms running at high sampling rates. Non-linear noise sources in the design were analyzed and suppressed. A null measurement with an optical beatnote signal using λ = 1064nm was conducted. It showed a sensitivity of 0.8 μ rad / Hz below 10Hz and 13.3 μ rad / Hz above, with a large dynamic range. The shown performance could enable the measuring of optical path lengths with sensitivities down to 0.14 pm / Hz and 2.3 pm / Hz, respectively, over several fringes in an interferometric setup.

© 2014 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.4640) Instrumentation, measurement, and metrology : Optical instruments
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.5060) Instrumentation, measurement, and metrology : Phase modulation

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: May 12, 2014
Revised Manuscript: June 16, 2014
Manuscript Accepted: June 22, 2014
Published: July 21, 2014

Citation
Thomas S. Schwarze, Oliver Gerberding, Felipe Guzmán Cervantes, Gerhard Heinzel, and Karsten Danzmann, "Advanced phasemeter for deep phase modulation interferometry," Opt. Express 22, 18214-18223 (2014)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-22-15-18214


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