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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 22, Iss. 15 — Jul. 28, 2014
  • pp: 18454–18463

Field-dependent magneto-optical Kerr effect spectroscopy applied to the magnetic component diagnosis of a rubrene/Ni system

Wen Li, Michael Fronk, Manfred Albrecht, Mechthild Franke, Dietrich R. T. Zahn, and Georgeta Salvan  »View Author Affiliations


Optics Express, Vol. 22, Issue 15, pp. 18454-18463 (2014)
http://dx.doi.org/10.1364/OE.22.018454


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Abstract

Polar magneto-optical Kerr effect (MOKE) spectroscopy in the energy range from 1.75 eV to 5 eV at different magnetic field strength was applied to study Ni nanostructures formed on rubrene nanoislands. The magnetic hysteresis curves measured by MOKE change the shape depending on the photon energy and therefore deviate from those measured by superconducting quantum interference device (SQUID) magnetometry. Similar optical effects were previously observed in inorganic heterostructures. Our observations show that it correlates to the change in lineshape of the MOKE rotation and ellipticity spectra as a function of magnetic field strength. We show that this spectral dependence on magnetic field can be exploited to separate the contributions of two magnetic components to the magneto-optical spectra and hysteresis. The proposed model does not require the a priori knowledge of the (magneto-)optical constants of the heterostructure and its components.

© 2014 Optical Society of America

OCIS Codes
(160.3820) Materials : Magneto-optical materials
(240.0310) Optics at surfaces : Thin films
(260.2130) Physical optics : Ellipsometry and polarimetry

ToC Category:
Spectroscopy

History
Original Manuscript: March 19, 2014
Revised Manuscript: May 8, 2014
Manuscript Accepted: June 24, 2014
Published: July 23, 2014

Citation
Wen Li, Michael Fronk, Manfred Albrecht, Mechthild Franke, Dietrich R. T. Zahn, and Georgeta Salvan, "Field-dependent magneto-optical Kerr effect spectroscopy applied to the magnetic component diagnosis of a rubrene/Ni system," Opt. Express 22, 18454-18463 (2014)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-22-15-18454


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