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Optics Express

Optics Express

  • Editor: Andrew M. Weiner
  • Vol. 22, Iss. 16 — Aug. 11, 2014
  • pp: 18904–18913

An indirect time-of-flight measurement technique with impulse photocurrent response for sub-millimeter range resolved imaging

Keita Yasutomi, Takahiro Usui, Sang-Man Han, Taishi Takasawa, Keiichiro Kagawa, and Shoji Kawahito  »View Author Affiliations


Optics Express, Vol. 22, Issue 16, pp. 18904-18913 (2014)
http://dx.doi.org/10.1364/OE.22.018904


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Abstract

This paper presents an indirect time-of-flight (TOF) measurement technique with an impulse photocurrent response of a lock-in pixel. By using a short-pulse laser, the generated photocurrent can be presumed to be an impulse response. This facilitates the utilization of the full high-speed performance of the photodetector and gives high range resolution. As a proof-of-concept, a test chip with a lock-in pixel based on draining-only modulation was implemented using 0.11 μm CMOS image-sensor technology. The test chip achieved a range resolution of 0.29 mm in a 50-mm measurable range, which corresponds to a time resolution of 1.9 ps and the successful acquisition of a 3-mm example step.

© 2014 Optical Society of America

OCIS Codes
(040.5160) Detectors : Photodetectors
(110.6880) Imaging systems : Three-dimensional image acquisition

ToC Category:
Imaging Systems

History
Original Manuscript: March 25, 2014
Revised Manuscript: June 23, 2014
Manuscript Accepted: July 12, 2014
Published: July 29, 2014

Citation
Keita Yasutomi, Takahiro Usui, Sang-Man Han, Taishi Takasawa, Keiichiro Kagawa, and Shoji Kawahito, "An indirect time-of-flight measurement technique with impulse photocurrent response for sub-millimeter range resolved imaging," Opt. Express 22, 18904-18913 (2014)
http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-22-16-18904


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